N.H. Code Admin. R. Env-A 804.19

Current through Register No. 25, June 20, 2024

Section Env-A 804.19 - Determining Control Efficiencies in Offset Lithography

Compliance with the control efficiency requirements for an add-on control device used to reduce VOC emissions from the dryer exhaust of heatset inks used in offset lithography, pursuant to Env-A 1216.03(a), shall be demonstrated using the test methods and procedures described in the following rules, as applicable:

(a) Env-A 802, Compliance Stack Testing for Stationary Sources;

(b) Env-A 804.12 through Env-A 804.14, Compliance Stack Testing for VOCs;

(c) Env-A 804.15 Mass Balance Alternative to Compliance Stack Testing for VOC; and

(d) Env-A 805, Capture Efficiency.

N.H. Code Admin. R. Env-A 804.19

#7788, eff 10-31-02; ss by #9802, eff 10-31-10 (from Env-A 804.17)

Amended by Volume XXXIX Number 19, Filed May 9, 2019, Proposed by #12762, Effective 5/1/2019, Expires 5/1/2029.