Where:
R = Efficiency of control device, percent.
Einlet,i = HAP concentration of control device inlet stream for test run i, mg/dscm.
Eoutlet,i = HAP concentration of control device outlet stream for test run i, mg/dscm.
n = Number of runs conducted for the performance test.
Where:
EHCl = Emission rate of HCl, lbs/hr.
C= average HCl concentration of vent or control device outlet stream for all test runs, lb/dscft.
AOF = average outlet volumetric flow rate of gas stream, dry basis, dscft/hr.
40 C.F.R. §63.8800