Catawba College, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC.

Docket Number: 04-011. Applicant: Catawba College, Salisbury, NC 28114. Instrument: Electron Microscope, Model JEM-1011. Manufacturer: JEOL, Japan. Intended Use: See notice at 69 FR 34654, 2004. Order Date: December 16, 2003.

Docket Number: 04-012. Applicant: University of Los Angeles, Los Angeles, CA 90095-1547. Instrument: Dual Beam Electron Microscope/Focused Ion Beam Milling Machine, Model Nova 600 Nanolab. Manufacturer: Fei Company, the Netherlands. Intended Use: See notice at 69 FR 34654, June 22, 2004. Order Date: August 6, 2003.

Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States either at the time of order of each instrument OR at the time of receipt of application by U.S. Customs and Border Protection.