Ex Parte Zhao et alDownload PDFPatent Trial and Appeal BoardDec 19, 201312684039 (P.T.A.B. Dec. 19, 2013) Copy Citation UNITED STATES PATENT AND TRADEMARKOFFICE UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 12/684,039 01/07/2010 Maosheng Zhao 007660.C02/DSM/LOW K/MDG 4370 44257 7590 12/19/2013 PATTERSON & SHERIDAN, LLP - - APPM/TX 3040 POST OAK BOULEVARD, SUITE 1500 HOUSTON, TX 77056 EXAMINER CROWELL, ANNA M ART UNIT PAPER NUMBER 1716 MAIL DATE DELIVERY MODE 12/19/2013 PAPER Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE ____________________ BEFORE THE PATENT TRIAL AND APPEAL BOARD ____________________ Ex parte MAOSHENG ZHAO, JUAN CARLOS ROCHA-ALVAREZ, INNA SHMURUN, SOOVA SEN, MAO D. LIM, SHANKAR VENKATARAMAN, and JU-HYUNG LEE ____________________ Appeal 2012-011198 Application 12/684,039 Technology Center 1700 ____________________ Before CATHERINE Q. TIMM, MICHAEL P. COLAIANNI, and GEORGE C. BEST, Administrative Patent Judges. TIMM, Administrative Patent Judge. DECISION ON APPEAL STATEMENT OF CASE Appellants appeal under 35 U.S.C. § 134 from the Examiner’s decision to reject claims 1-3 and 5-17. We have jurisdiction under 35 U.S.C. § 6(b). We AFFIRM. Appeal 2012-011198 Application 12/684,039 2 The claims are directed to a chamber for processing semiconductor substrates (Claim 1) and a semiconductor substrate processing system including the chamber (Claim 11). Figure 1 depicts an apparatus containing the chamber, and is reproduced below: Figure 1 is a schematic diagram of a CVD reactor 100 Claim 1 is reproduced below with reference numerals inserted for an understanding of an embodiment of the claimed invention. 1. A chamber [102] for processing semiconductor substrates, comprising: a chamber wall [sidewall 158] defining an enclosure ; a plurality of electrodes comprising a showerhead electrode [120], a substrate support electrode [126], and a Appeal 2012-011198 Application 12/684,039 3 blocking plate electrode [164], each electrically isolated from at least one of the other electrodes, at least one of the electrodes disposed inside the enclosure; and a switch [180] with at least two positions [SW1 and SW2], each position selectably coupling a different pair of the electrodes together. (Claims App’x at Br. 23.) According to the Specification, switch position SW1 provides a short circuit between the lid 112 (together with the blocking plate 164) (contact A) and the showerhead 120 (contact C) (Spec. ¶ 0033). In the SW1 position, the chamber is configured for performing a chemical vapor deposition (CVD) process or a plasma enhanced chemical vapor deposition (PECVD) process (Spec. ¶ 0036). When performing PECVD, the plasma is generated in the reaction volume 154 (id.). Position SW2 provides a short circuit between the showerhead 120 (contact C) and the ground terminal 184 (contact B) (Spec. ¶ 0033). In the SW2 position, the lid 112 (together with the blocking plate 164) and the showerhead 120 form a pair of spaced apart electrodes (Spec. ¶ 0037). In the SW2 position, the chamber is configured for a cleaning process (id.). In the cleaning process, the plasma is generated in the gas mixing plenum 152 and not in the reaction volume 154 (id.). The Examiner rejects the claims as follows: A. Claims 1-3, 5, and 7-9 are rejected under 35 U.S.C. § 102(b) as anticipated by Yanagida1; B. Claim 6 is rejected under 35 U.S.C. § 103(a) as obvious over Yanagida in view of Morita2; 1 Yanagida, JP 04-132219 A, pub. May 6, 1992. 2 Morita et al., US 5,815,366, patented Sept. 29, 1998. Appeal 2012-011198 Application 12/684,039 4 C. Claim 10 is rejected under 35 U.S.C. § 103(a) as obvious over Yanagida in view of Mumola.3 D. Claims 11, 12, and 14-16 are rejected under 35 U.S.C. § 103(a) as obvious over Yanagida in view of Sasaki.4 E. Claim 13 is rejected under 35 U.S.C. § 103(a) as obvious over Yanagida in view of Sasaki, and further in view of Morita. F. Claim 17 is rejected under 35 U.S.C. § 103(a) as obvious over Yanagida in view of Sasaki, and further in view of Mumola. G. Claims 1, 2, 5, 7-9, 11, 12, and 14-16 are rejected under 35 U.S.C. § 103(a) as obvious over Sasaki in view of Shinagawa.5 H. Claim 3 is rejected under 35 U.S.C. § 103(a) as obvious over Sasaki in view of Shinagawa, and further in view of Masumoto.6 I. Claims 6 and 13 are rejected under 35 U.S.C. § 103(a) as obvious over Sasaki in view of Shinagawa, and further in view of Morita. J. Claims 10 and 17 are rejected under 35 U.S.C. § 103(a) as obvious over Sasaki in view of Shinagawa, and further in view of Mumola. Appellants do not argue any claim apart from the others for any of the rejections. Therefore, for each rejection we select a single claim as representative to decide the issues on appeal. OPINION Rejection A With regard to the rejection of claims 1-3, 5, and 7-9 as anticipated by Yanagida, we select claim 1 as representative to decide the issue on appeal. 3 Mumola, US 5,292,400, patented Mar. 8, 1994. 4 Sasaki et al., JP 10-177993, pub. June 30, 1998. 5 Shinagawa et al., JP 01-192118, pub. Aug. 2, 1989. 6 Masumoto, JP 06-053176, pub. Feb. 25, 1994. Appeal 2012-011198 Application 12/684,039 5 We state the issue as follows: Have Appellants identified a reversible error in the Examiner’s finding that Yanagida’s switch 11a, 11b has at least two positions, each position selectably coupling a different pair of the electrodes together (compare Ans. 5 with Br. 10)? Yanagida is directed to a plasma treatment device useful for dry etching, plasma CVD, etc. (Yanagida translation, 4.) As pointed out by Appellants, Yanagida teaches operating the device in two modes. In the first mode, grid electrode 12 (showerhead electrode) and upper electrode 2 (blocking plate electrode) abut each other, and are insulated from chamber 1a and wafer-mounting electrode 5 (substrate support electrode) (Yanagida, Abs.). As shown in Figure 1(A), the first switch position (Fig. 1(A) at 11a, 11b) grounds electrode 12 via electrode 2 while substrate support electrode 5 is coupled to power. The Examiner finds that this configuration results in a first pair of electrode coupling (Ans. 15). Appellants do not dispute this finding. (No reply brief was filed.) To operate in the second mode, Yanagida teaches lowering electrode 12 and switching the switch 11a to connect electrode 2 to power and switching 11b to connect support electrode 5 to ground as shown in Figure 1(B). The Examiner finds that this creates a second pair of coupling between electrodes 2 and 5 (Ans. 15). Appellants do not dispute this finding. (No reply brief was filed.) The Examiner’s position is reasonable and not challenged by Appellants. A preponderance of the evidence supports the Examiner’s finding that Yanagida describes a chamber for processing semiconductor substrates including all the structures required by claim 1 including a switch Appeal 2012-011198 Application 12/684,039 6 with at least two positions, each position selectably coupling a different pair of electrodes together. Rejections B and C With regard to the rejection of claim 6 as obvious over Yanagida in view of Morita, and the rejection of claim 10 as obvious over Yanagida in view of Mumola, Appellants do not advance any further argument over and above the argument addressed above. Therefore, Appellants have not identified a reversible error in either of these rejections. Rejection D With respect to the rejection of claims 11, 12, and 14-16 as obvious over Yanagida in view of Sasaki, Appellants contend that Sasaki does not teach or suggest a showerhead electrode, or any reason to use Sasaki’s switch 9 to connect to a showerhead electrode (Br. 14). This argument does not address the Examiner’s rejection. The Examiner relies upon Yanagida for its teachings of a switch and showerhead electrode and relies upon Sasaki as evidence with regard to a teaching of frequency and power levels. Appellants have not identified a reversible error in the Examiner’s rejection of claims 11, 12, and 14-16. Rejections E and F With regard to the rejection of claim 13 as obvious over Yanagida in view of Sasaki and Morita, and the rejection of claim 17 as obvious over Yanagida in view of Sasaki and Mumola, Appellants do not advance any further argument over and above the argument addressed above. Therefore, Appellants have not identified a reversible error in either of these rejections. Rejection G With regard to the rejection of claims 1, 2, 5, 7-9, 11, 12, and 14-16 as obvious over Sasaki in view of Shinagawa, we again select claim 1 as Appeal 2012-011198 Application 12/684,039 7 representative for deciding the issue on appeal. The issue is: Have Appellants identified a reversible error in the Examiner’s finding of a reason to incorporate a showerhead electrode into the apparatus of Sasaki and to modify the switch of Sasaki based upon the teachings of Shinagawa (compare Ans. 10 with Br. 17-18)? Sasaki’s device includes a chamber for processing semiconductor substrates with a lower electrode 2 (substrate support electrode), an upper electrode 3 (blocking plate electrode 3), and a switch (Sasaki, Fig. 1; Abs.; ¶ 0010). In a first position, the switch selectably couples the lower electrode 2 and housing 8 and a cleaning gas is introduced through opening 4 while generating plasma 11b to clean shielding members 5 and 6 (Sasaki ¶¶ 0010- 11; Fig. 1). In a second position, the switch selectably couples the lower electrode 2 to electrode 3 in order to generate plasma 11a and treat the semiconductor substrate 1 (Sasaki, ¶ 0012; Fig. 2). Shinagawa’s device includes a chamber for processing semiconductor substrates, with three electrodes, i.e., a first electrode 22 (blocking plate electrode), second electrode 23 (showerhead electrode), and a third electrode 24 (substrate support electrode) (Shinagawa, Abs.; Fig. 1(a)). Like Sasaki, Shinagawa has a switch that in one position couples two electrodes (showerhead electrode and substrate support electrode) to perform the semiconductor substrate treatment. However, instead of having only one electrode in the upper portion of the chamber, Shinagawa has two, i.e., Shinagawa has a blocking plate electrode 22 that is separate from the showerhead electrode 23. Shinagawa couples those two upper electrodes (blocking plate electrode 22 and showerhead electrode 23) in order to generate a plasma between those two electrodes (Shinagawa. Abs.; Fig. Appeal 2012-011198 Application 12/684,039 8 1(b)). Therefore, Shinagawa, by switching the coupling of electrodes, generates plasma in two locations within the chamber. Appellants contend that “there is no reason taught or suggested in either Sasaki or Shinagawa to import the showerhead electrode or switching mechanism of Shinagawa into the apparatus of Sasaki.†(Br. 17.) However, the Examiner has articulated specific reasons for the modifications, i.e., to enhance gas distribution and to generate plasma in different regions of the chamber for different processes such as cleaning gas plenum, cleaning upper chamber portions, or processing the substrate using a remote plasma (Ans. 10). Both Sasaki and Shinagawa teach coupling different electrodes together to generate plasma in different regions (Sasaki, Figs 1-2; Shinagawa, Figs. 1(a) and 1(b)). It appears that those of ordinary skill in the art understood the functions of the various electrode configurations of the prior art and how to couple them to generate plasma in various desired locations to obtain predictable results. A preponderance of the evidence supports the Examiner’s finding of a reason to combine. Rejections H-J With regard to the rejection of claim 3 as obvious over Sasaki in view of Shinagawa and Masumoto; the rejection of claims 6 and 13 over Sasaki in view of Shinagawa and Morita; and the rejection of claims 10 and 17 over Sasaki in view of Shinagawa and Mumola, Appellants do not advance any further argument over and above the argument addressed above (Br. 19-21). Therefore, Appellants have not identified a reversible error in either of these rejections. Appeal 2012-011198 Application 12/684,039 9 CONCLUSION We sustain the Examiner’s rejections. DECISION The Examiner’s decision is affirmed. TIME PERIOD FOR RESPONSE No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1). AFFIRMED bar Copy with citationCopy as parenthetical citation