Ex Parte Zhang et alDownload PDFBoard of Patent Appeals and InterferencesJun 29, 201211521921 (B.P.A.I. Jun. 29, 2012) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte XIAO-BO ZHANG, KAI-LI JIANG, and SHOU-SHAN FAN ____________ Appeal 2011-000781 Application 11/521,921 Technology Center 1700 ____________ Before CHARLES F. WARREN, BEVERLY A. FRANKLIN, and LINDA M. GAUDETTE, Administrative Patent Judges. GAUDETTE, Administrative Patent Judge. Appeal 2011-000781 Application 11/521,921 2 DECISION ON APPEAL Appellants appeal under 35 U.S.C. § 134(a) from the Examiner’s decision1 finally rejecting claims 1-4, 7, 8, 15-21, and 27-29 the only claims pending in the Application.2 We have jurisdiction under 35 U.S.C. § 6(b). We AFFIRM. The claims stand rejected under 35 U.S.C. § 103(a) as follows: 1. claims 1-4, 7, 8, 15-20, and 27 are rejected as unpatentable over US ‘7063 in view of US ‘1084 and US ‘8895, and further in view of Tsunoda6 and Bunshah7 (Ans.8 4-8); 2. claim 21 is rejected as unpatentable over US ‘108 in view of Hafner9 and US ‘889 (Ans. 9-10); 3. claims 28 and 29 are rejected as unpatentable over US ‘706 in view of US ‘108 and US ‘889, and further in view of Tsunoda and Bunshah as applied to claim 1, further in view of Lacerda10 (Ans. 10-11) 1 Final Office Action mailed Dec. 21, 2009. 2 Appeal Brief filed May 3, 2010 (“Br.”) 3 Dai, US 6,232,706 B1, issued May 15, 2001. 4 Jiang, US 7,045,108 B2, issued May 16, 2006. 5 Awano, US 7,311,889 B2, issued Dec. 25, 2007. 6 T. Tsunoda et al., Thermoelectric Properties of Ru- or Ge-doped B-FeSi2 Films Prepared by Electron Beam Deposition, 381(2) Thin Solid Films 296-302 (2001). 7 Rointan F. Bunshah, Handbook of Deposition Technologies for Films and Coatings: Science, Technology and Applications 643-680, 681-739, 763-821 (Noyes Pubs. 1994). 8 Examiner’s Answer mailed Jul. 6, 2010. 9 Jason H. Hafner et al., Catalytic Growth of Single-wall Carbon Nanotubes From Metal Particles, 296 Chemical Physics Letters 195-202 (1998). 10 R. G. Lacerda et al., Growth of High-quality Single-wall Carbon Nanotubes Without Amorphous Carbon Formation, 84(2) Applied Physics Letters 269-271 (2004). Appeal 2011-000781 Application 11/521,921 3 Appellants’ traversal of the Examiner’s rejections is based on limitations found in the independent claims, i.e., claims 1 and 21, which are reproduced below from the Claims Appendix to the Appeal Brief: 1. A method of fabricating a carbon nanotube array, comprising steps of: providing a substrate having a flat and smooth surface; depositing a catalyst layer on the surface of the substrate at a positive deposition rate of less than 0.01 nanometers per second; growing super-aligned carbon nanotubes directly from the catalyst layer, such growing be achieved by a chemical vapor deposition process; wherein the chemical vapor deposition process is conducted at a low pressure in range from about 0.1 to about 10 torr and executed in a furnace; and the chemical vapor deposition process comprises a step of supplying a reaction gas into the furnace; and when supplying the reaction gas, no other gases are introduced into the furnace; wherein the reaction gas is a pure hydrocarbon gas. 21. A method of fabricating a super-aligned carbon nanotube array, comprising steps of: providing a substrate having a surface; depositing a catalyst layer on the surface of the substrate; positioning the substrate with the catalyst in a furnace; heating the furnace to a predetermined temperature; supplying a reaction gas into the furnace, wherein the reaction gas is a pure hydrocarbon gas. growing a plurality of carbon nanotubes on the substrate such that the carbon nanotube array is formed on the substrate, wherein the step of growing a plurality of carbon nanotubes on the substrate is achieved by a chemical vapor deposition process, the chemical vapor deposition process is conducted at a pressure in a Appeal 2011-000781 Application 11/521,921 4 range from about 0.1 to about 10 torr and at a temperature for growing carbon nanotubes in a range from about 680°C to about 750°C. Appellants’ arguments are based, in part, on a disagreement over the scope and meaning of the phrase “wherein the reaction gas is a pure hydrocarbon gas” (claims 1 and 21). Appellants contend this phrase is properly interpreted as excluding from the chemical vapor deposition process gases other than a hydrocarbon gas. (See e.g., Br. 11 (“US ‘108 only discloses how to manufacture a clean carbon nanotube array under condition of a mixture of gas including carbon containing gas and the protecting gas. . . . Thus, US ‘108 also fails to disclose or suggest how to manufacture a clean carbon nanotube array under a condition of a pure hydrocarbon gas in a pressure range from about 0.1 to about 10 torr.”) and 15 (“[T]the reaction gas of Hafner . . . is also actually a mixture of C2H4, Ar and H2, not a pure hydrocarbon gas.”).) During examination, claim terms must be given their broadest reasonable interpretation consistent with the specification. In re ICON Health & Fitness, Inc., 496 F.3d 1374, 1379 (Fed. Cir. 2007). Non-conventional transitional phrases (i.e., other than “comprising,” “consisting essentially of,” and “consisting”) are interpreted in light of the specification to determine whether open or closed claim language is intended. See, e.g., AFG Indus., Inc. v. Cardinal IG Co., Inc., 239 F.3d 1239, 1244-45 (Fed. Cir. 2001) (interpreting “composed of” in same manner as “consisting essentially of” based on specification and other evidence); Crystal Semiconductor Corp. v. TriTech Microelectronics Int’l, Inc., 246 F.3d 1336, 1348 (Fed. Cir. 2001) (noting that the term “having” in transitional phrase “does not create a presumption that the body of the claim is open”); Lampi Corp. v. American Power Products, Inc., 228 F.3d 1365, 1376 (Fed. Cir. 2000) (interpreting Appeal 2011-000781 Application 11/521,921 5 “having” as open terminology, allowing the inclusion of other components in addition to those recited). Based on the Specification (e.g. Spec. 7:14-16 (“In the present embodiment, the reaction gas can be a pure carbon source gas or a mixture of the carbon source gas and less than about 5% of the protecting gas.”)), we interpret the phrase “wherein the reaction gas is a pure hydrocarbon gas” as requiring the presence of a hydrocarbon gas. However, the above-cited language in the Specification (as well as the portions of the Specification cited by the Examiner (Ans. 15)) supports a broad reading of the term “is” as open claim language encompassing a carbon source gas together with a protecting gas (i.e., both alternatives listed for the above-described embodiment). Further, while appealed claim 1 does further limit the chemical vapor deposition process by the recitation “when supplying the reaction gas, no other gases are introduced into the furnace” (claim 1), we still find no basis in claims 1 and 21 for limiting the gases present in the reactant gas to a hydrocarbon gas, e.g., the claim language does not preclude the presence of a protecting gas or carrier gas. Having interpreted the claim language in dispute, we now consider the issues raised with respect to independent claims 1 and 21. Claim 1: The issues we consider with respect to claim 1 are: did the Examiner reversibly err in finding the applied prior art discloses or suggests a deposition rate of “less than 0.01 nanometers/s” and “the chemical vapor deposition process . . . at a low pressure in [a] range from about 0.1 to about 10 torr” as claimed. The Examiner relies on the combined teachings of US ‘108, which teaches the use of electron beam vapor deposition for catalyst deposition, US ‘889 and Tsunoda, which teach electron beam vapor deposition rates of .16 nm/s and .139 Appeal 2011-000781 Application 11/521,921 6 nm/s, respectively, and Bunshah, which teaches the desirability of low deposition rates for producing crystalline films critical to further growth of carbon nanotubes. (Ans. 5 and 13-14.) Appellants argue US ‘108, US ‘889, and Tsunoda fail to teach or suggest deposition rates as low as those recited in claim 1. (Br. 7-9.) However, Appellants have not fully addressed the Examiner’s detailed findings with respect to the teachings of Bunshah (Ans. 13-14 (explaining why Bunshah would have led one of ordinary skill in the art to utilize lower deposition rates than those taught in US ‘889 and Tsunoda; cf. Br. 9)) and, therefore, have not persuasively argued that the Examiner erred in determining one of ordinary skill in the art would have been motivated to modify the teachings of the applied prior art to employ a deposition rate as claimed. (Cf. Ans. 12 (noting Appellants have not demonstrated any criticality in the claimed range).) Appellants argue the Examiner erred in finding the applied prior art discloses or suggests conducting “the chemical vapor deposition process . . . at a low pressure in [a] range from about 0.1 to about 10 torr” as claimed. (Br. 10-12.) Appellants concede US ‘889 discloses using a pressure of 1-10 Torr, but argue the reference only discloses this range as suitable for a mixture of gases, not a pure hydrocarbon gas. (Br. 11.) Appellants’ argument is unpersuasive for at least the following three reasons. First, we have interpreted claim 1 as encompassing a chemical vapor deposition process wherein the reaction gas includes a protecting gas such as the hydrogen utilized in US ‘889. Second, a reasonable interpretation of US ‘889 is that the reactive gas may be a hydrocarbon gas by itself, or in combination with hydrogen or argon. (See col. 9, ll. 55-60 (“As carbon sources there may be mentioned hydrocarbons such as methane, ethane, propane, butane, benzene, Appeal 2011-000781 Application 11/521,921 7 toluene, xylene, hexane, light oil or the like. The reactive gas used as the plasma generating source may also be a mixture of these gases with hydrogen, or a mixture containing a carrier such as argon.”).) Finally, as explained by the Examiner (Ans. 18), US ‘706 suggests turning off the argon supply while ethylene is flown through the reactor during chemical vapor deposition, which meets the requirements of the claim 1 supplying step even as narrowly interpreted by Appellants to preclude the presence of gases other than a hydrocarbon gas. Claim 21: With respect to the rejection of claim 21, Appellants again argue the relied- upon prior art fails to disclose or suggest the use of a reaction gas as claimed because the reactant gases are a mixture of a hydrocarbon gas with argon and hydrogen. This argument is not persuasive in light of our claim interpretation, as explained in connection with the rejection of claim 1. Appellants also argue one of ordinary skill in the art would not have been motivated to modify US ‘108 to use a pure hydrocarbon gas such as C2H4 because such substitution would result in a high partial pressure of the carbon containing gas, which is contrary to US ‘108’s preference for a relatively low partial pressure. (Br. 13-14.) Appellants’ argument appears to misapprehend the Examiner’s rejection, which relies on Hafner for a teaching of using C2H4 in combination with argon to generate 0.5 torr of partial pressure, which the Examiner finds to be a relatively low partial pressure (Ans. 16-17). Appellants have not shown error in the Examiner’s finding that 0.5 torr partial pressure is sufficiently low that one of ordinary skill in the art would not have been dissuaded from using Hafner’s C2H4/Ar mixture in US ‘108’s deposition process and, in fact, would have been Appeal 2011-000781 Application 11/521,921 8 motivated to use this mixture “to allow bulk catalytic production of nano tubes by metal catalysts (Abstract, Hafner)” (Ans. 9). CONCLUSION In sum, for the reasons expressed in the Answer and above, we are not persuaded of error in the Examiner’s obviousness determination as to appealed claims 1-4, 7, 8, 15-21, and 27-29. Accordingly, we sustain all three grounds of rejection. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1). AFFIRMED ssl Copy with citationCopy as parenthetical citation