Ex Parte Yamamoto et alDownload PDFBoard of Patent Appeals and InterferencesDec 16, 201090007824 (B.P.A.I. Dec. 16, 2010) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 90/007,824 11/28/2005 6033542 283161US0RX 9293 22850 7590 12/16/2010 OBLON, SPIVAK, MCCLELLAND MAIER & NEUSTADT, L.L.P. 1940 DUKE STREET ALEXANDRIA, VA 22314 EXAMINER MCDONALD, RODNEY GLENN ART UNIT PAPER NUMBER 1724 MAIL DATE DELIVERY MODE 12/16/2010 PAPER Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte Kobelco Research Institute, Inc., Patent Owner and Appellant ____________ Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 Technology Center 3900 ____________ Before ROMULO H. DELMENDO, SALLY G. LANE, and JEFFREY B. ROBERTSON, Administrative Patent Judges. ROBERTSON, Administrative Patent Judge. DECISION ON APPEAL1 1 The two-month time period for filing an appeal or commencing a civil action, as recited in 37 C.F.R. § 1.304, or for filing a request for rehearing, as recited in 37 C.F.R. § 41.52, begins to run from the “MAIL DATE” shown on the PTOL-90A cover letter attached to this decision. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 2 Kobelco Research Institute, Inc., the owner of the patent under reexamination (hereinafter the “‘542 Patent”), appeals under 35 U.S.C. §§ 134(b) and 306 from a final rejection of claims 1-10 (Substitute Appeal Brief filed December 23, 2009, hereinafter “App. Br.,” at 4; Final Office Action mailed August 15, 2008).2 We have jurisdiction under 35 U.S.C. §§ 134(b) and 306. We AFFIRM. STATEMENT OF THE CASE This reexamination proceeding arose from a third-party request for ex parte reexamination filed by Tosoh Corporation (Request for Ex Parte Reexamination filed November 28, 2005). An application for reissue of the ‘542 Patent was filed on May 9, 2006 and assigned Application No. 11/430,299. The reexamination and reissue proceedings were merged on October 10, 2006. (Decision Merging the Reexamination and the Reissue mailed October 13, 2006.) We heard Patent Owner’s oral arguments on November 17, 2010, a written transcript of which will be entered into the record in due course. The ‘542 Patent states that the invention includes an aluminum (Al) alloy film deposited by sputtering using a target of Al alloy with rare earth elements such as neodymium (Nd) in amounts of 0.05-15 atomic (at) %. (Col. 4, ll. 13-20, col. 5, ll. 7-8, col. 8, ll. 1-5.) 2 See Patent Assignment Abstract of Title, Reel 013907, Frame 0953, which was entered into the record of this proceeding as “Title Report” on November 20, 2005. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 3 Claims 1 and 6 on appeal read as follows: 1. A sputtering target consisting of an alloy of Al and 0.05-15 at% Nd. 6. The sputtering target of claim 1, wherein said sputtering target is produced by a method comprising: -melting Al and Nd under vacuum; -adjusting the content of Nd in an Al matrix to be in a range of 0.05 to 15 at%; and -allowing the alloy of Al and Nd to solidify. (Claims App’x, App. Br. 20.) The Examiner relied upon the following as evidence of unpatentability (Examiner’s Answer mailed March 17, 2010, hereinafter “Ans.,” 2): Tawara EP 0 531 808 March 17, 1993 Appellant relied on certain parts of the following (App. Br. 21)3: Ex. A: Decl. of Professor Jeffrey T. Glass dated February 6, 2008; and Ex. B: Decl. of Hiroshi Goto dated February 1, 2008. The Examiner rejected claims 1-10 as follows: 3 Appellant also presents the Declaration of Eisuke Kusumoto dated February 5, 2008 as evidence of commercial success. However, as the Examiner points out, this declaration pertains to obviousness under 35 U.S.C. § 103(a), whereas the Examiner’s rejection of the claims over Tawara is under 35 U.S.C. § 102(b). (Ans. 11.) Accordingly, even if we assume that it is persuasive, we need not address the Kusumoto Declaration in this decision because it is ineffective to rebut an anticipation rejection. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 4 I. Claims 1-10 under 35 U.S.C. § 251 as being based on a defective reissue declaration (Ans. 3-5); and II. Claims 1-10 under 35 U.S.C. § 102(b) as anticipated by Tawara (Ans. 5-7). ISSUES Reissue Declaration The Examiner stated the addition of dependent claims alone is not an error correctable by reissue per Patent Office Policy. (Ans. 3-5.) In the instant case, the Examiner stated that the scope of the patent is not alleged to be deficient in whole or in part because independent claim 1 has not been amended and would cover broader subject matter than added claims 6-10. (Ans. 3.) Appellant acknowledges that the Board’s recent decision in Ex parte Tanaka, 93 USPQ2d 1291 (BPAI 2009) (Precedential) is dispositive of this issue, but argues that because Tanaka is on appeal to the Court of Appeals for the Federal Circuit, it is not binding on the instant case. (Reply Br. 14.) Appellant argues that In re Handel, 312 F.2d 943 (CCPA 1963) and Hewlett-Packard Co. v. Bausch & Lomb, Inc., 882 F.2d 1556 (Fed. Cir. 1989) provide support for Appellant’s position that reissue is a proper forum for adding dependent claims 6-10. (App. Br. 17-18.) 35 U.S.C. § 102(b) Rejection Regarding claim 1, the Examiner found that Tawara discloses a layer formed from Al and a rare earth element alloy, where the rare earth element is preferably neodymium in amounts of 0.05 to 10 at %. (Ans. 6.) The Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 5 Examiner also found that Tawara discloses the reflecting layer may be formed by sputtering using an alloy of Al and rare earth element. (Id.) Regarding claim 6, the Examiner found that “the sputtering product is suggested by Tawara regardless of how the product was produced.” (Id.) Appellant argues that Tawara does not specifically disclose a sputtering target consisting of an alloy of Al and Nd because as evidenced by the Glass Declaration, Tawara discloses many alloy combinations such that one of ordinary skill in the art would not readily envisage the recited alloy. (App. Br. 5-7.) Appellant also argues that a reflective layer of a binary alloy of Al and Nd may be formed by other methods besides an alloy target. (App. Br. 7-8.) Appellant contends that the Glass Declaration provides evidence that the alloy sputtering target produced by the method recited in claim 6 imparts a different structure and different properties to the resulting alloy. (App. Br. 11-13.) Specifically, Appellant contends that when produced in a vacuum, alloys do not contain nitrided or oxidized products, which would be present under other techniques for producing alloys such as atmospheric melting methods. (App. Br. 13-14.) Thus, the principal issues in this appeal are: Did the Examiner err in rejecting claims 1-10 under 35 U.S.C. § 251 as being based on a defective reissue declaration? Did the Examiner err in finding claim 1 anticipated by Tawara? Did the Examiner err in finding that the process of producing the alloy recited in claim 6 results in an alloy that is anticipated by Tawara? Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 6 FINDINGS OF FACT (“FF”) 1. Tawara discloses a “reflecting layer formed from an alloy consisting of aluminium and a metal of a rare earth element” where the rare earth element “more preferably, is neodymium or gadolinium” and is present in a range of 0.05 to 10 at %. (Col. 3, ll. 5-15.) 2. Tawara discloses that the reflective layer “can be formed conveniently by the method of sputtering using an alloy of aluminum and the rare earth element of a specified composition as the target.” (Col. 4, ll. 11-15.) 3. Example 1 of Tawara discloses a reflecting layer of a binary alloy of aluminum and neodymium or gadolinium that is deposited by the sputtering method. (Col. 4, ll. 35-41.) 4. Professor Glass declared that “Tawara is silent with respect to the method by which an A1-Nd alloy sputtering target may be made.” (Glass Declaration, page 8.) Professor Glass also stated: This deficiency is important as there are several methods for making alloys. These methods include: spray forming (using a molten mixture to spray on a collector using N2 gas atomizer), vacuum melting and casting (also includes substitution of inert gas after evacuation to vacuum condition), powder processing, ordinary melting and casting in the air, flame or plasma spray, electron- beam melting and plasma arc melting. (Id.) Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 7 5. Professor Glass declared: “The alloys resulting from each of these processes var[y] widely in their structure and properties” and that “the more common approach would be either an ordinary melting and casting in air or a powder processing method.” (Glass Declaration, page 8.) 6. Professor Glass declared that melting Al and Nd under vacuum provides superior properties such as greater purity and controllable homogeneous microstructure and composition as well as a target with fewer voids or cracks and a greater density than alloys produced by the powder processing method. (Glass Declaration, page 8.) Professor Glass also stated that the vacuum melting process provides a target with greater purity and fewer defects than alloys produced by melting and casting in air. (Glass Declaration, page 9.) PRINCIPLES OF LAW The specific wording used in §251 limits the scope of the Director's power to grant reissue patents only in situations in which the original patent is deemed wholly or partly inoperative or invalid by reason of a defective specification or drawing, or by reason of the patentee claiming more or less than he had a right to claim in the patent. The Office's interpretation of §251 to disallow reissue applications that simply add narrower claims to the reissue patent when no assertion of inoperativeness or invalidity for the reasons set forth in §251 can be made by the patentee, is in keeping with the plain wording and scope of §251. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 8 Ex parte Tanaka, 93 USPQ2d at 1299 (emphasis in original). [E]ven though product-by-process claims are limited by and defined by the process, determination of patentability is based on the product itself. The patentability of a product does not depend on its method of production. If the product in a product-by-process claim is the same as or obvious from a product of the prior art, the claim is unpatentable even though the prior product was made by a different process. In re Thorpe, 777 F.2d 695, 697 (Fed. Cir. 1985) (internal citations omitted). “Where a product-by-process claim is rejected over a prior art product that appears to be identical, although produced by a different process, the burden is upon the applicants to come forward with evidence establishing an unobvious difference between the claimed product and the prior art product.” In re Marosi, 710 F.2d 799, 803 (Fed. Cir. 1983). ANALYSIS Appellant separately argues claims 1 and 6, but does not separately argue claims 2-5 and 7-10. Accordingly, we confine our discussion to appealed claims 1 and 6, which contain claim limitations representative of the arguments made by Appellants pursuant to 37 C.F.R. § 41.37(c)(1)(vii). Issue 1 We decline Appellant’s invitation to revisit the issue in Tanaka of whether the addition of dependent claims alone is appropriate for a reissue proceeding. Though Tanaka may be on appeal to the Court of Appeals for the Federal Circuit, we are still bound by the reasoning set forth therein. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 9 Thus, as Appellant acknowledges, Tanaka is dispositive of the present issue. Accordingly, we affirm the Examiner’s rejection of claims 1-10 under 35 U.S.C. § 251. Regarding Handel and Hewlett-Packard, as these cases were extensively discussed in Tanaka, we see no need to repeat that discussion here. See Tanaka, 93 USPQ2d at 1294-96. Issue 2 We discern no error in the Examiner’s finding that Tawara discloses the recited alloy. Tawara expressly describes a binary alloy of aluminum and “a metal of a rare earth element” (emphasis added), “more preferably . . . neodymium or gadolinium.” (FF 1, 3; Ans. 7-8.) Appellant’s position as evidenced by the Glass Declaration that Tawara broadly discloses other combinations of alloys such that one of ordinary skill in the art would not envisage a binary alloy of aluminum and neodymium is belied by Tawara’s express preference for a binary alloy of aluminum and neodymium. (FF 1; Ans. 9-10.) For similar reasons, Appellant’s arguments regarding other possible methods discussed in the Goto and Glass Declarations by which the reflective layer of a binary alloy of Al or Nd may be formed are also not persuasive. The method of forming the reflective layer disclosed in Tawara is sputtering using aluminum alloy targets. (FF 2, 3; Ans. 11.) Tawara’s Example 1 discloses a reflecting layer of a binary alloy of aluminum and neodymium produced by the sputtering method. (FF 3.) Thus, even though the Goto and Glass Declaration discuss other methods of sputtering that could be employed in forming the reflective layer, the existence of such Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 10 other methods does not change the express disclosure of an alloy sputtering target in Tawara. In addition, because Tawara discloses the alloy is “binary,” there are no other elements present in the binary alloy sputtering target. To the extent that Appellant contends that the “consisting of” language in claim 1 excludes sputtering targets in which the aluminum and neodymium alloy has been produced under atmospheric conditions, due to the presence of nitrides and oxides in the resulting alloy, we disagree. Such impurities are not excluded by the “consisting of” language in the claims. Conoco Inc. v. Energy & Environmental International LC, 460 F.3d 1349 (Fed. Cir. 2006) (“Although ‘consisting of’ is a term of restriction, the restriction is not absolute. The Patent Board of Appeals has interpreted ‘consisting of’ to ‘close[ ] the claim to the inclusion of materials other than those recited except for impurities ordinarily associated therewith.’ Ex parte Davis, 80 U.S.P.Q. 448, 450 (Pat. Office Bd. App. 1948).”) Issue 3 Claim 6, however, stands on different footing than claim 1. Claim 6 is a product-by-process claim in which the sputtering target is produced by “melting Al and Nd under vacuum.” Because Tawara discloses a binary alloy of Al and Nd, we are of the opinion that the Examiner properly shifted the burden to Appellant to provide evidence to show a difference between the alloys of Tawara and the alloys as claimed. Appellant stated that Tawara does not specify how the binary alloy is produced. (FF 4.) Appellant has provided evidence in the Glass Declaration that alloys may be produced by Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 11 several different methods, and that alloys produced by the vacuum melting procedure have superior properties over alloys produced by other methods. (FF 4-6.) In light of Appellant’s evidence, we cannot agree with the Examiner that the alloy target of claim 6 is anticipated by Tawara regardless of how the product was produced. The Examiner does not discuss why the evidence provided by Appellant is insufficient to show that the alloys disclosed in Tawara do not necessarily have the same structure and properties as the alloys produced by the process recited in claim 6. Accordingly, we reverse the Examiner’s decision to reject claims 6-10 as anticipated by Tawara. CONCLUSION On this record, Appellant has failed to demonstrate any error in the Examiner’s factual findings and conclusions that claims 1-10 were properly rejected under 35 U.S.C. § 251 as being based on a defective reissue declaration and claim 1 is anticipated by Tawara. However, we agree with Appellant that the Examiner erred in finding that the process of producing the alloy recited in claim 6 results in an alloy that is anticipated by Tawara. DECISION The Examiner’s decision to reject claims 1-10 under 35 U.S.C. § 251 is affirmed. The Examiner’s decision to reject claims 1-5 under 35 U.S.C. § 102(b) as being anticipated by Tawara is affirmed. Appeal 2010-009563 Reexamination Control 90/007,824 Reissue Application 11/430,299 Patent 6,033,542 12 The Examiner’s decision to reject claims 6-10 under 35 U.S.C. § 102(b) as being anticipated by Tawara is reversed. Requests for extensions of time in this ex parte reexamination proceeding are governed by 37 C.F.R. § 1.550(c). See 37 C.F.R. § 41.50(f). AFFIRMED cu FOR PATENT OWNER: Oblon, Spivak, McClelland Maier & Neustadt, L.L.P. 1940 Duke Street Alexandria, VA 22314 FOR THIRD-PARTY REQUESTER: Gregory S. Rosenblatt Wiggin and Dana, LLP One Century Tower P.O. Box 1832 New Haven, CT 06508 Copy with citationCopy as parenthetical citation