Ex Parte UgawaDownload PDFPatent Trial and Appeal BoardJul 19, 201813907713 (P.T.A.B. Jul. 19, 2018) Copy Citation UNITED STA TES p A TENT AND TRADEMARK OFFICE APPLICATION NO. FILING DATE FIRST NAMED INVENTOR 13/907,713 05/31/2013 Hiroaki Ugawa 126187 7590 07/23/2018 Keysight Technologies, Inc. In care of: CPA Global 900 Second A venue South Suite 600 Minneapolis, MN 55402 UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www .uspto.gov ATTORNEY DOCKET NO. CONFIRMATION NO. 20120108-02 1086 EXAMINER ZAKARIA, AKM ART UNIT PAPER NUMBER 2868 NOTIFICATION DATE DELIVERY MODE 07/23/2018 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address(es): keysightdocketing@cpaglobal.com notice.legal@keysight.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte HIROAKI UGA WA Appeal2017-007463 Application 13/907, 713 Technology Center 2800 Before KAREN M. HASTINGS, CHRISTOPHER C. KENNEDY, and MICHAEL G. McMANUS, Administrative Patent Judges. McMANUS, Administrative Patent Judge. DECISION ON APPEAL The Examiner finally rejected claims 1-9 of Application 13/907,713 under 35 U.S.C. § 103. Final Act. (June 30, 2016) 4--14. Appellant 1 seeks reversal of these rejections pursuant to 35 U.S.C. § 134(a). We have jurisdiction under 35 U.S.C. § 6. For the reasons set forth below, we REVERSE. 1 The real party in interest is identified as Keysight Technologies, Inc. Appeal Br. 1. Appeal2017-007463 Application 13/907, 713 BACKGROUND The present application generally relates to a method of measuring impedance in electrical components and an apparatus for same. In one aspect, the method is described as including connecting a device under test (DUT) in series or parallel to a signal line with respect to a signal source, transmitting a measurement signal from the signal source through the signal line, and measuring an input signal into the DUT, a reflected signal reflected from the DUT, and a passed signal passed through the DUT. Spec. ,r 10. Scattering parameters (S-parameters) S11 and S21 based on respective measured values of the input signal, reflected signal, and passed signal are calculated; and an impedance Zx of the DUT is calculated from S-parameters and a characteristic impedance. Id. ,r,r 10, 33. Claim 1 is representative and is reproduced below: 1. An impedance measurement method comprising: connecting a device under test (DUT) characterized by a DUT input and a DUT output, in series to a signal line with respect to a signal source and a load device, said DUT input being connected to said signal line and said DUT output being connected to said load device; transmitting a measurement signal from the signal source through the signal line; measuring an input signal into the DUT, a reflected signal reflected from the DUT, and a passed signal passed through the DUT into said load device while the DUT input is connected to the signal line, the DUT output is connected to the load device, and the measurement signal is transmitted through the signal line; calculating S-parameters S11 and S21 based on respective measured values of the input signal, reflected signal and passed signal; and calculating an impedance Zx of the DUT from a ratio of S11 divided by S21 and a characteristic impedance. 2 Appeal2017-007463 Application 13/907, 713 Appeal Br. 16 (Claims App.). REJECTIONS The Examiner maintains the following rejections: 1. Claims 1 and 2 are rejected under 35 U.S.C. § 103 as obvious over Wang et al. 2 in view of Agilent. 3 Final Act. 4--6. 2. Claim 3 is rejected under 35 U.S.C. § 103 as obvious over Wang in view of Agilent and further in view of Adamian 4 and Y acoubian et al. 5 Id. at 6-8. 3. Claim 4 is rejected under 35 U.S.C. § 103 as obvious over Adamian in view of Agilent. Id. at 8-10. 4. Claims 5-7 are rejected under 35 U.S.C. § 103(a) as obvious over Adamian in view of Mow et al. 6 Id. at 10-13. 5. Claims 8 and 9 are rejected under 35 U.S.C. § 103(a) as obvious over Adamian in view of Mow, and further in view of Yacoubian. Id. at 13-14. DISCUSSION Rejection 1. The Examiner rejected claims 1 and 2 as obvious over Wang and Agilent. Id. at 4--6. 2 US 2005/0093554 Al, published May 5, 2005. 3 Agilent Technologies, User's Guide, 8719ET/20ET/22ET, 8719ES/20ES/22ES, Network Analyzers (1999-2002, 2012). 4 US 7,068,049 B2, issued June 27, 2006. 5 US 5,656,973, issued Aug. 12, 1997. 6 US 2013/0234741 Al, published Sept. 12, 2013. 3 Appeal2017-007463 Application 13/907, 713 Claim 1 In rejecting claim 1, the Examiner found that the primary reference, Wang, lacks an explicit teaching of calculating impedance Zx from a ratio of S11 to S21 . Id. at 6. The Examiner further found that the secondary reference, Agilent, teaches such calculation. Id. (citing Agilent, 6-23, 7-23, 7-26, 7-27, and 7-40). The Examiner additionally found that Wang teaches "measuring ... a passed signal (V 2M) passed through the DUT into said load device ( 16, 23 or 25)." Id. at 5. Appellant argues that the rejection of claim 1 is in error on two bases. Appeal Br. 6-7. First, Appellant argues that the cited references do not teach impedance Zx. Id. Appellant argues that the Examiner found merely that Wang teaches "a system that is capable of performing" the claimed measurement and that this falls short of what is required for unpatentability. Id. at 6. Appellant further argues that the Specification includes an explicit definition of Zx that differs from the impedance of Agilent. Id. at 7. Claim 1 specifies that it pertains to an impedance measurement method where the device under test (DUT) is connected "in series." Appeal Br. 16 (Claims App.). The claim further requires "calculating an impedance Zx of the DUT from a ratio of S11 divided by S21 and a characteristic impedance." Id. In regard to impedance Zx of the DUT when connected in series ( as required by claim 1 ), the Specification provides as follows: With the DUT, there are four vector voltage ratios, in other words, four S-parameters, and among these, S 11 expresses 4 Appeal2017-007463 Application 13/907, 713 reflection from the input port of the DUT. S21 expresses forward direction transmission through the DUT. To express these as formulas: S21 = b2/a1 =2Zo/(Zx+2Zo), S11 = b/a1=Zx/(Zx+2Zo). By taking the ratio of the two, is obtained and Zx is thereby determined. If Zx divided by Z0 is written as "zx," zx is expressed by: zx = 2S11/S21. This is the formula that expresses the method according to the present invention for impedance measurement of the serially connected DUT. Spec. ,r 33; see also Fig. l(a). Thus, in view of the foregoing, the impedance Zx of claim 1 is defined as Zx = 2ZoS11/S21. In the Answer, the Examiner indicates that "[i]t is common knowledge to [those ofJ ordinary skill in the art that NA apparatus used in the prior art references of Wang, Agilent, Mow and Adamian is capable of S-parameters or complex impedance measurement and additionally they are also teaching method to obtain those measurement similar to that of the Appellant." Answer 7-8. The Examiner then cites to certain portions of Agilent described as teaching impedance measurements. Id. at 8. The Examiner does not, however, cite to any disclosure of the impedance Zx as defined by the Specification and required by claim 1. Accordingly, the Examiner has not shown that the cited references, Wang and Agilent, teach impedance Zx. 5 Appeal2017-007463 Application 13/907, 713 The Appellant's second argument against the rejection of claim 1 concerns the claim element "measuring ... a passed signal passed through the DUT into said load device while the DUT input is connected to the signal line, the DUT output is connected to the load device, and the measurement signal is transmitted through the signal line." Appeal Br. 6-7, 16 (Claims App.). Appellant asserts that each figure of Wang shows a measuring device on the same side as signal source 14 rather than the same side as the load 23. Id. at 7. Accordingly, Appellant argues, there is no measurement of a signal that is passed through the DUT. Id. Figures 2 and 4 from Wang are reproduced below for reference. 30--/ NElWORK A.NAL'l"2ER S·PARAMETER CALCULATOR FIG. 2 6 Appeal2017-007463 Application 13/907, 713 """"=~- ?1 DUT >"" <~'!\\~ ""Y- .2:!'l v NETWORK .ANALVZ.ER S,PA.RA!'itETER CA.LC(.J:l.A TOR FIG. 4 Figure 2 of Wang depicts a configuration of the system 20 where DUT 12 is operatively connected with the source 14, which supplies an input signal V 1 to the input port Pl of the DUT, and a matched load 23, having an impedance indicated at ZM1, is connected at the output port P2. Wang ,r 49. Figure 4 of Wang depicts system 20 where DUT 12 is operatively connected with the source 14, which supplies an input signal V 2 to the output port P2 of the DUT, and a matched load 25, having an impedance indicated at ZM2, is connected at the input port Pl. Id. ,r 53. Neither figure depicts an NA probe arranged to detect a signal that has passed through the DUT. The Examiner, citing ,r 2 of Wang, determines that Wang teaches measurement of "pass thru" signals. Answer 8 ( emphasis omitted). Paragraph 2 of Wang teaches to measure the accuracy of a network by determining its S-parameters which are "indicative of the degree of signal transmission and reflection at the ports of the network." Wang ,r 2. 7 Appeal2017-007463 Application 13/907, 713 While this teaching does concern signal transmission through a device under test, it does not teach or suggest measuring a signal "passed through the DUT" as required by claim 1. Accordingly, Appellant has shown reversible error in the rejection of claim 1. Claim 2 Claim 2 depends from claim 1 and further requires "connecting the DUT between a first port and a second port of a network analyzer, with one of the ports being connected to a signal source and the other being connected to said load device." Appeal Br. 16 (Claims App.). The Examiner found that Wang teaches the limitations of claim 2. Final Act. 6. Appellant argues that Wang teaches a network analyzer with only a single port. Id. at 8. Appellant further argues that Wang teaches only a configuration where the single connection to the network analyzer is on the same side as the measurement signal. Id. Accordingly, Appellant argues, the DUT is not taught to be "between" two ports of a network analyzer. In the Answer, the Examiner further determines that it is "common knowledge" that other network analyzers perform measurements at two ports on the DUT. Answer 9 ( emphasis omitted). As discussed in connection with claim 1, Wang teaches a network analyzer with a single port. Accordingly, it does not teach "connecting the DUT between a first port and a second port of a network analyzer." Nor does the Examiner's determination that it is "common knowledge" that other network analyzers perform measurements at two ports cure such defects as there is no adequate explanation of how or why such teachings would be combined. See Perfect Web Techs. Inc. v. Info USA Inc., 587 F.3d 1324, 8 Appeal2017-007463 Application 13/907, 713 1330 (Fed. Cir. 2009) ("[T]o invoke 'common sense' or any other basis for extrapolating from prior art to a conclusion of obviousness, [the factfinder] must articulate its reasoning with sufficient clarity for review."). Claim 3 Claim 3 depends from claim 2 and further requires that "each of said measurements is made in respective cases of interchange of the signal source and the load device by a switch to obtain a geometric mean ( GM) value of Zx, determined in the respective cases, as a function of frequency of the measurement signal." Appeal Br. 16 (Claims App.). As determined above, neither Wang nor Agilent has been shown to teach taking a measurement passed through the DUT. Accordingly, it follows that such references do not teach to take a measurement of the signal passed through the DUT by interchange of the signal source and the load device. Claim 4 Claim 4 is an independent claim to an impedance measurement apparatus. The Examiner found that each limitation of claim 4 is taught by Adamian in view of Agilent. Final Act. 8-10. Appellant argues that the cited references fail to teach "a DUT" and fail to teach "an impedance Zx of the DUT." Appeal Br. 9-10. For the same reasons as set forth with regard to claim 1, Agilent fails to teach impedance Zx as required by the claims. Accordingly, the rejection of claim 4 is in error. 9 Appeal2017-007463 Application 13/907, 713 Claim 5 Claim 5 is an independent claim to an impedance measurement method. Claim 5 stands rejected as obvious over Adamian in view of Mow. Final Act. 10-12. The claim requires the step of "calculating an impedance Zx of the DUT from a ratio of S11 divided by S21 and a characteristic impedance." Appeal Br. 17 (Claims App.). The Examiner found that the primary reference, Adamian, lacks an explicit teaching of several elements of the claim, including impedance Zx. Final Act. 11. The Examiner found that the secondary reference, Mow teaches impedance Zx as follows: However, Mow teaches ... calculating an impedance Zx (para. [0081] - obtain S 11 complex impedance measurement and/or an S21 complex forward transfer coefficient measurement) of the DUT (100) from a ratio of S 11 divided by S21 and a characteristic impedance ( desired impedance characteristics in step 304 in figure 11 ). Final Act. 11. Mow ,r 81 provides as follows: Tester 232 may, for example, obtain an Sll ( complex impedance) measurement and/ or an S21 ( complex forward transfer coefficient) measurement. The values of Sll and S21 (phase and magnitude) may be measured at fundamental frequency f0 ( as an example). Mow ,r 81. In regard to ,r 81, Appellant argues that "[ t ]he paragraph only states that a complex impedance measurement can be calculated. There is no teaching of Zx as defined in the present application in the cited paragraph." Appeal Br. 12. The Examiner additionally cites to Figure 11 of Mow which teaches the following step: "ADJUST LOAD-PULL TUNERS TO EXHIBIT DESIRED IMPEDANCE CHARACTERISTICS (E.G., VSWR = [1:1, 5:1, 10:1] LOAD-PULL PHASE= [O, 45°, 90°, ... , 315°])." Mow, Fig. 11. 10 Appeal2017-007463 Application 13/907, 713 Appellant argues that "this step refers to adjusting the impedance of the load pull tuners, i.e., the load device identified by the Examiner. This is not the impedance of the DUT, no less Zx as defined in the present application." Appeal Br. 12. A preponderance of the evidence supports Appellant's argument that the cited portions of Mow do not teach impedance Zx for a DUT connected in parallel as defined by the Specification. See Spec. ,r 55; Fig. l(b). Claims 6-9 Claims 6-9 each depend, directly or indirectly, from claim 5. For the same reasons set forth with regard to claim 5, Appellant has shown error in the rejection of these claims. CONCLUSION The rejections of claims 1-9 are reversed. REVERSED 11 Copy with citationCopy as parenthetical citation