Ex Parte Rosenblum et alDownload PDFBoard of Patent Appeals and InterferencesApr 24, 201211112880 (B.P.A.I. Apr. 24, 2012) Copy Citation UNITED STATES PATENT AND TRADEMARKOFFICE UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 11/112,880 04/22/2005 Martin Philip Rosenblum VIT 0018 IA/40926.92 5332 23368 7590 04/24/2012 DINSMORE & SHOHL LLP FIFTH THIRD CENTER, ONE SOUTH MAIN STREET SUITE 1300 DAYTON, OH 45402-2023 EXAMINER MOORE, KARLA A ART UNIT PAPER NUMBER 1716 MAIL DATE DELIVERY MODE 04/24/2012 PAPER Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE ________________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ________________ Ex parte MARTIN PHILIP ROSENBLUM, XI CHU, LORENZA MORO, KENNETH JEFFREY NELSON, PAUL E. BURROWS, MARK E. GROSS, MAC R. ZUMHOFF, PETER E. MARTIN, CHARLES C. BONHAM, and GORDON L. GRAFF ________________ Appeal 2010-011415 Application 11/112,880 Technology Center 1700 ________________ Before CATHERINE Q. TIMM, ROMULO H. DELMENDO, and GEORGE C. BEST, Administrative Patent Judges. BEST, Administrative Patent Judge. DECISION ON APPEAL The Examiner finally rejected claims 9-42 and 66-81 of Application 11/112,880. Pursuant to 35 U.S.C. § 134, Appellants come to the Board seeking reversal. We have jurisdiction pursuant to 35 U.S.C. § 6(b). For the reasons set forth below, we AFFIRM. App App depo ’880 inven depo comp Clus tool eal 2010-0 lication 11 The ’880 siting mul applicatio tion that i Figure 7 siting mul rised of c ter tool sec section 33 11415 /112,880 applicati tilayer coa n, reprodu s the subje is a block tiple layer luster tool tion 310 i 0 is used f Bac on disclose tings onto ced below ct of the c diagram o s on a shee section 31 s used for or organic 2 kground s and seek sheet sub , shows th laims at is f an arran t substrate 0 and in-l inorganic layer depo s to claim strates. Sp e embodim sue in this gement of . Spec. 15 ine tool se layer depo sition. Id. an appara ec. 1. Figu ent of the appeal. a hybrid t . Tool 30 ction 330. sition, wh tus for re 7 of the claimed ool for 0 is Spec. 33. ile in-line Appeal 2010-011415 Application 11/112,880 3 In cluster tool section 310, a central robot 312 is located in a central hub region 313. Id. Central robot 312 transports substrates 6 between various process stations in a programmed sequence. Id. Examples of the various types of process stations include a thin film coating deposition station 314, a thermal evaporation station 316, a mask stocker station 318, a load lock 320, an etching station 322, a sputtering station 324 and a mask aligner station 326. Id. Each of the peripheral stations, as well as the central hub region 313, are coupled to a vacuum means 350 (which can be, for example, a vacuum pump) to establish and maintain internal vacuum as required. Id. In-line tool section 330 includes organic material deposition station 334, organic material curing section 336, and substrate transport 338. Id. at 42. Substrate transport 338 is capable of moving the substrate at least between organic material deposition station 334 and organic material curing section 336. Id. Isolation valve 333 is used to separate organic material deposition station 334 from the mask alignment chamber 332. Id. The claims on appeal seek to cover various configurations of this general nature. Issues 1) Whether the Examiner correctly rejected claims 9-11, 19-42, and 66-71 of the ’880 application under 35 U.S.C. § 103(a) as obvious over U.S. Patent No. 6,827,788 B2 (“Takahashi,” issued Dec. 7, 2004). 2) Whether the Examiner correctly rejected claims 12-18 of the ’880 application under 35 U.S.C. § 103(a) as obvious over Takahashi in view of U.S. Patent No. 3,661,117 (“Cornelius,” issued May 9, 1972). App App for m Taka ll. 23 eal 2010-0 lication 11 3) W ob (“ 4) W ob U 5) W ob Takaha aking dep hashi is re Figure 1 -24. The s 11415 /112,880 hether the vious ove Feldman,” hether the vious ove .S. Patent N hether the vious ove shi. The ex osition co produced is a schem ubstrate p Examiner r Takahash issued Fe Examiner r Takahash o. 7,429, Examiner r Takahash P aminer ci atings on s below. atic view rocessing 4 correctly i in view b. 2, 1982 correctly i in view 300 B2 (“ correctly i in view rior Art ted Takaha ubstrates. of a substr equipment rejected cl of U.S. Pa ). rejected cl of Feldma Kido,” issu rejected cl of Kido. shi as tea Ans. 4-5. ate proces includes a aims 66-7 tent No. 4 aims 72 an n further i ed Sept. 3 aims 74-8 ching a hy Figure 1 f sing devic plurality 1as ,313,254 d 73 as n view of 0, 2008). 1 as brid tool rom e. Col. 5, of vacuum App App cham 58-c centr lock in th proc depo orga mate with Figu Corn eal 2010-0 lication 11 bers inclu ol. 6, l. 22 al directio chambers e diagram) essing cha Corneliu sition stat nic materi rial evapo the evapo re 1 is repr Figure 1 elius. The 11415 /112,880 ding proc . Processin n-changin . Id. The eq for transf mbers and s. The Ex ion that the al. Ans. 9. rator, a ma rator, and oduced be is a view device co essing cha g chambe g chamber uipment a erring the a vacuum aminer cit Examine The mater terial depo a material low. of a mater mprises cr 5 mbers 21, rs 21, 22, a 8. Id. Cha lso includ substrate i pumping ed Cornel r determin ial deposit sition noz confineme ial deposit ucible 10, 22, 23, an nd 24 are mbers 11L es a transf n sequenc system (no ius for its t es is capab ion station zle in flui nt system ion device substrate d 24. Id. at located ar and 11R er system e to the plu t shown). eaching o le of vapo comprise d commun . Id. Corne described support 12 col.5, l. ound are load- (not show rality of Id. f a materia rizing s a ication lius’s in , and n l Appeal 2010-011415 Application 11/112,880 6 carrier gas source 14. Col. 2, ll. 25-27. Vaporizable material 20 is placed in the crucible and heated. Id. at col. 2, ll. 32-35. The vaporized material collects in head space 22 and is carried out of crucible 10 via tube 30. Id. at col. 2, ll. 44-58. The material exits tube 30 through nozzle 34. Id. Deposition of the material on substrate 36 is controlled by the operation of shutter 50. Id. at col. 2, ll. 68-74. Feldman. The Examiner cited Feldman for its teaching of an exchange mechanism to facilitate transport in a multi-chamber tool. Ans. 15. Kido. The Examiner cited Kido for its teaching of multiple containers including both organic and inorganic vapor deposition sources which are independently heated in the deposition chamber. Ans. 12. Discussion Issue 1 The Examiner rejected claims 9-11, 19-42, and 66-71 as obvious over Takahashi. Claim 9 is representative of this group of claims and is reproduced below: 9. A device for depositing material onto a discrete substrate, said device comprising: a cluster tool configured to deposit at least one inorganic layer onto said substrate; an in-line tool configured to deposit at least one organic layer onto said substrate, said in-line tool operatively coupled to said cluster tool; and a reduced-pressure source placed in vacuum communication with at least said in-line tool such that during at least a portion of deposition of said organic layer onto said discrete substrate, said reduced-pressure source operates to create an at least partially evacuated environment about said substrate. Appeal 2010-011415 Application 11/112,880 7 Br. 14 (emphasis added). As the Examiner noted, Takahashi discloses a tool for depositing material onto discrete substrates comprising a cluster tool that is capable of depositing at least one inorganic layer onto the substrates, an in-line tool capable of depositing at least one organic barrier layer onto the substrate, and a reduced pressure source. Id. at 3. Each of these elements is operably connected to the others. Id. Appellants argue that Takahashi does not expressly teach two of the claim limitations: (1) a cluster tool configured to deposit at least one inorganic layer onto said substrate, and (2) an in-line tool configured to deposit at least one organic layer onto said substrate. Br. 7. Takahashi does not expressly teach any particular configuration for its processing chambers 21, 22, 23, and 24, but notes that the configuration of these chambers will be customized to the details of the process for which the tool will be used. Takahashi, col. 10, ll. 9-11. Appellants’ claim is similarly devoid of any structural limitations on the processing chambers included in the claims. See, e.g., claim 9. Rather than providing any structural limitations on the claimed apparatus, Appellants rely upon statements of intended use for the different portions of the claimed apparatus to distinguish the claimed device from the prior art. Br. 9. These claims, however, are directed to an apparatus. As such, the apparatus must be distinguished from the prior art on the basis of structure, and where there is reason to conclude that the prior art apparatus is inherently capable of performing the claimed function, the burden shifts to the applicant to show that the claimed function patentably distinguishes the Appeal 2010-011415 Application 11/112,880 8 claimed structure from the prior art structure. See In re Schreiber, 128 F.3d 1473, 1478 (Fed. Cir. 1997); In re Hallman, 655 F.2d 212, 215 (CCPA 1981). A statement of intended use does not distinguish the claimed invention over the prior art. In re Sinex, 309 F.2d 488, 492 (CCPA 1962). A use limitation does not impart a structural feature different from the features disclosed in the prior art. In re Yanush, 477 F.2d 958, 959 (CCPA 1973). In this case, Appellants have not pointed to any claimed structural detail that differentiates their device from the prior art. They emphasize that the exemplary processes discussed in Takahashi—sputtering, chemical vapor deposition, and etching—are typically associated with the deposition and processing of inorganic layers. Ans. 9 (discussing Takahashi, col. 10, ll. 11-48). Appellants therefore suggest that Takahashi’s device is somehow incompatible with deposition of organic materials. This argument fails for at least two reasons. First, this argument improperly limits the knowledge of the skilled artisan to that which is disclosed within the four corners of Takahashi. Second, even if one reads Takahashi as limited to using the device for the specific processes disclosed in the reference, the Examiner explained that at least some of the processes expressly disclosed in Takahashi can be used to deposit layers of organic material, Ans. 14-15. Other than attorney argument, Appellants have offered no evidence (e.g., an expert’s declaration) or other meaningful discussion based on facts demonstrating error on the part of the Examiner. Br. 8, 28. Thus, we discern no error in the Examiner’s position that there appears to be no patentable structural difference between Takahashi’s device and that of claim 9. Appeal 2010-011415 Application 11/112,880 9 For this reason, Appellants have not met their burden of demonstrating a structural limitation recited in their claims that distinguishes the claimed device from the device taught and suggested by Takahashi. Thus, we sustain the Examiner’s rejection of claims 9-11, 19-42, and 66-71. Issue 2 The Examiner rejected claims 12-18 as obvious over Takahashi in view of Cornelius. Claim 12 is representative of this group of claims and is reproduced below: 12. (Original) The device of claim 11, wherein said organic material deposition station comprises: an organic material evaporator; an organic material deposition nozzle in fluid communication with said evaporator; and an organic material confinement system disposed about said nozzle. Appellants argue that claims 12-18 were improperly rejected because the asserted combination of Takahashi and Cornelius fail to disclose an organic material deposition station. Br. 9-10. As Appellants correctly point out, Cornelius does not discuss the deposition of organic materials. Indeed, Cornelius discusses the deposition of atoms, rather than molecules, col. 2, ll. 32-43, and specifically mentions the deposition of conductive metals like silver and copper, and well as dielectric materials such as zinc oxide, col. 3, ll. 8-17. Appellants, however, have failed to identify any reason why the Cornelius device, when operated under appropriate conditions, would not serve to deposit organic materials. For example, as the Examiner states, a person of skill in the art would know that organic materials can serve as Appeal 2010-011415 Application 11/112,880 10 dielectrics in a variety of applications. Ans. 15. Furthermore, the choice of temperature to which the crucible is heated to vaporize a particular organic material as opposed to a metal is well within the level of skill in the art. Most importantly, Appellants have not identified any structural difference between their claimed organic material deposition station and the material deposition station taught in Cornelius. The appealed claims are apparatus claims, and must be distinguished from the prior art on the basis of their structure. Schreiber, 128 F.3d 1478. We therefore sustain the Examiner’s rejection of claims 12-18. Issue 3 The Examiner rejected claims 66-71 as obvious over Takahashi in view of Feldman. Claim 66 is representative and is reproduced below: 66. A tool comprising: an encapsulation device comprising: an organic layer forming station comprising: an organic material deposition station; an organic material curing station cooperative with said organic material deposition station; a substrate-transport configured to convey a substrate between at least said organic material deposition station and said organic material curing station; a reduced-pressure source placed in vacuum communication with said organic material deposition station such that during at least a portion of deposition of an organic layer onto said discrete substrate, said reduced- pressure source operates to create an at least Appeal 2010-011415 Application 11/112,880 11 partially evacuated environment about said substrate; and a thermal control mechanism cooperative with at least one of said organic material deposition station and organic material curing station such that a temperature therein can be controlled during formation of said organic material on said substrate; and a barrier layer forming station configured to place at least one inorganic layer onto said substrate or said organic layer formed on said substrate, said barrier layer forming station and said organic layer forming station cooperative with one another such that upon operation thereof at least one encapsulated member is formed on said substrate; a load lock to facilitate selective vacuum isolation between said encapsulation device and a remainder of said tool; and an exchange mechanism to facilitate transport of said at least one encapsulated member between said encapsulation device and said remainder of said tool. Appellants argue that the claims in this group were erroneously rejected because Feldman does not remedy the alleged failure of Takehashi to teach all of the claimed elements. Br. 10. In particular, Appellants argue that Feldman is directed to depositing semiconductor layers that include transition metal borides and doped silicon regions. Id. Therefore, Appellants argue, the skilled artisan would not have been motivated to modify Feldman’s teachings in combination with Takahashi in a manner that rendered the claimed invention obvious. Id. at 10-11. Appeal 2010-011415 Application 11/112,880 12 Appellants’ arguments regarding Feldman are misdirected. The Examiner cited Feldman as teaching a substrate accumulator/exchange mechanism that facilitates transport in a multi-chamber tool. Final Office Action 8-9 (May 28, 2009); Ans. 15. For this reason, Appellants’ discussion of the process carried out in Feldman is irrelevant to the particular teaching for which it was cited. Furthermore, Appellants’ remaining objections concerning the alleged use of the tool taught in Takahashi versus their intended use do not distinguish their claimed invention from the prior art in any structural manner. For this reason, we sustain the rejection of claims 66-71. Issue 4 The Examiner rejected claims 72 and 73 as obvious over Takahashi in view of Feldman further in view of Kido. Claim 72 is representative of this group of claims and is reproduced below: 72. The tool of claim 66, wherein said at least one organic layer forming station is further configured to deposit at least one inorganic layer onto said substrate. In seeking reversal of these rejections, Appellants present the arguments that we have already found insufficient in connection with the claims discussed in Issues 1 and 3, supra. For those reasons, we also affirm the rejection of claims 72 and 73. Issue 5 The Examiner rejected claims 74-81 as obvious over Takahashi in view of Kido. Claim 74 is representative 74. The device of claim 9, wherein said in-line tool is further configured to deposit at least one inorganic layer onto said substrate. Appeal 2010-011415 Application 11/112,880 13 In arguing for reversal of the rejections of these claims, Appellants present the arguments that we have already found insufficient in connection with the claims discussed in Issue 1, supra. For those reasons, we also affirm the rejection of claims 74-81. Conclusion For the reasons stated above, we sustain the rejections of claims 9-42 and 66-81 of the ’880 application. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a). AFFIRMED sld Copy with citationCopy as parenthetical citation