Ex Parte McHugoDownload PDFBoard of Patent Appeals and InterferencesApr 23, 201210892983 (B.P.A.I. Apr. 23, 2012) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte SCOTT A. MCHUGO ____________ Appeal 2010-002724 Application 10/892,983 Technology Center 2800 ____________ Before SCOTT R. BOALICK, JOHN A. JEFFERY, and STANLEY M. WEINBERG, Administrative Patent Judges. JEFFERY, Administrative Patent Judge. DECISION ON APPEAL Appellant appeals under 35 U.S.C. § 134(a) from the Examiner‟s rejection of claims 1-10. We have jurisdiction under 35 U.S.C. § 6(b). We affirm. STATEMENT OF THE CASE Appellant‟s invention is a vertical cavity surface emitting laser (VCSEL) device that uses a void or gap in a mirror stack to define a light aperture and a thin protective layer to cover the gap. The protective layer enables the device to pass various reliability and stress tests, including the Appeal 2010-002724 Application 10/892,983 2 “Wet High Temperature Operating Life” test. See generally Spec. ¶¶ 0003- 07; Fig. 2. Claim 1 is illustrative with key disputed limitations emphasized: 1. A device comprising: a first mirror stack through which a hole extends, wherein a gap extends from a sidewall of the hole into the first mirror stack; a second mirror stack; a cavity layer between the first mirror stack and the second mirror stack; and a protective layer that conforms to the sidewall of the hole, sealing an end of the gap at the sidewall of the hole while leaving the hole open. THE REJECTIONS 1. The Examiner rejected claims 1-4 and 8-10 under 35 U.S.C. § 103(a) as unpatentable over Kwak (US 6,917,640 B2; July 12, 2005 (filed May 28, 2003)) and Zhu (US 6,589,805 B2; July 8, 2003). Ans. 4-5. 1 2. The Examiner rejected claims 6 and 7 under 35 U.S.C. § 103(a) as unpatentable over Kwak, Zhu, and Maegawa (US 2003/0042542 A1; Mar. 6, 2003). Ans. 5-6. 3. The Examiner rejected claim 5 under 35 U.S.C. § 103(a) as unpatentable over Kwak, Zhu, and Comizzoli (US 5,851,849; Dec. 22, 1998). Ans. 6. 1 Throughout this opinion, we refer to (1) the Appeal Brief filed November 29, 2007; (2) the Examiner‟s Answer mailed April 8, 2009; and (3) the Reply Brief filed June 8, 2009. Appeal 2010-002724 Application 10/892,983 3 THE OBVIOUSNESS REJECTION OVER KWAK AND ZHU The Examiner finds that Kwak discloses every recited feature of representative claim 1 including a “protective layer” (insulation film 160) conforming to a sidewall of “hole” B, and sealing an end of a “gap” which the Examiner equates to insulation regions 150 (also denoted “C” in Figure 4). Ans. 4-5, 7-17, 28. Although the Examiner acknowledges that Kwak‟s gap is not “matter-less” (i.e., a void), the Examiner nonetheless cites Zhu for this teaching in concluding that the claim would have been obvious. Id. Appellant argues that the cited prior art does not teach or suggest (1) a gap extending from a sidewall of a hole into a first mirror stack; (2) a protective layer conforming to the hole‟s sidewall; and (3) sealing an end of the gap at the hole‟s sidewall while leaving the hole open as claimed. App. Br. 18-28, 36-40, 51; Reply Br. 1-27. According to Appellant, not only does the cited prior art not recognize the problems solved by the claimed invention, namely improving the device‟s moisture resistance in a high- humidity environment, there is no reason to combine the references as the Examiner proposes absent impermissible hindsight. Id. The issues before us, then, are as follows: ISSUES 1. Under § 103, has the Examiner erred in rejecting claim 1 by finding that Kwak and Zhu collectively would have taught or suggested (a) a gap extending from a sidewall of a hole into a first mirror stack; (b) a protective layer conforming to the hole‟s sidewall; and (c) sealing an end of the gap at the hole‟s sidewall while leaving the hole open? Appeal 2010-002724 Application 10/892,983 4 2. Is the Examiner‟s reason to combine the teachings of these references supported by articulated reasoning with some rational underpinning to justify the Examiner‟s obviousness conclusion? ANALYSIS Based on the record before us, we find no error in the Examiner‟s obviousness rejection of representative claim 1. First, we note that the VCSEL device shown in Figure 2 of the present application is strikingly similar to that of Kwak‟s Figure 4, including providing an insulative layer 160 conforming to a hole‟s 2 sidewall—a layer that is structurally similar to the conforming protective layer 250 in Appellant‟s invention. Compare Spec. ¶ 0014; Fig. 2 with Kwak, col. 5, ll. 55-59; col. 6, ll. 42-48; Figs. 4, 7d. These respective conforming layers are shown in Appellant‟s Figure 2 and Kwak‟s Figure 4 reproduced below: 2 Fig. 4‟s reference identifier “B.” Appeal 2010-002724 Application 10/892,983 5 Appellant’s Figure 2 and Kwak’s Figure 4 showing respective conforming layers 250 and 160 Appellant‟s Figure 2 also shows a gap 212 that extends from a hole‟s 3 sidewall into mirror stack 210 that is sealed by the protective layer 250. Spec. ¶ 0014. This structure differs, however, from Kwak‟s Figure 4 in that Kwak‟s insulative film 160 overlays insulation regions 150 (also denoted “C” in Figure 4) that surround oxidation aperture “D.” Kwak, col. 5, ll. 3- 11, 54-60; Fig. 4. The Examiner maps Kwak‟s insulation regions to the recited “gap” (Ans. 4, 12-13)—a mapping that Appellant disputes. Reply Br. 24. Although we agree with Appellant to the extent that the insulation itself in these regions is not a gap under its plain meaning, namely “a separation in space,” 4 nothing in the claim precludes the recited gap from including insulative material within the gap, particularly in light of the preamble‟s open-ended “comprising” language which does not exclude the presence of 3 Fig. 3B‟s element 270. Spec. ¶ 0023. 4 MERRIAM WEBSTER‟S COLLEGIATE DICTIONARY 480 (10th ed. 1993). Appeal 2010-002724 Application 10/892,983 6 additional unrecited elements. 5 We reach this conclusion noting that not only does the region between Kwak‟s upper reflector layer 140 and active layer 120 that includes the insulation regions 150 and oxidation aperture constitute a “gap” under the term‟s broadest reasonable interpretation, Kwak‟s insulation regions in Figure 4 surround,, extend from, and are radially coextensive withthe oxidation aperture as shown in the enlarged detail view of Kwak‟s Figure 4 below: Enlarged detail view of Kwak’s Figure 4 showing oxidation aperture and surrounding insulation regions This coextensive structure 150 at least suggests that the insulative regions essentially fill the gap that includes the oxidation aperture at the aperture‟s circular periphery. See Kwak, col. 5, ll. 3-11. We therefore see no error in the Examiner‟s position at least to the extent that the insulative regions are associated with a gap, namely the region including the corresponding oxidation aperture. 6 And as shown in Kwak‟s Figure 4, this gap and associated insulative regions extend from a hole‟s sidewall into a first mirror stack as claimed. 5 “„Comprising‟ is a term of art used in claim language which means that the named elements are essential, but other elements may be added and still form a construct within the scope of the claim.” Genentech, Inc. v. Chiron Corp., 112 F.3d 495, 501 (Fed. Cir. 1997) (citation omitted). 6 See Ans. 15 (referring to Kwak‟s “material gap” and “solid gap”). Appeal 2010-002724 Application 10/892,983 7 We also find no error in the Examiner‟s reliance on Zhu merely to show that forming a gap as a “void” was known in the art in light of Zhu‟s circumferential cavity 128, and that forming such a gap in Kwak would have been obvious. Ans. 5, 12, 15. See also Zhu, col. 4, ll. 40-42, 57-59; Fig. 1 (describing sealed subsurface circumferential cavity 128). Appellant‟s arguments regarding Zhu do not squarely address the limited purpose for which Zhu was cited (see App. Br. 24-28, 36-40, 51; Reply Br. 1-27), and, accordingly, do not persuade us of error in the Examiner‟s articulated basis for combining the references which has some rational underpinning to justify the Examiner‟s obviousness conclusion. To the extent that Appellant may be implying that removing at least some of the material forming insulation regions in Kwak to form voids in the associated gap, as the Examiner proposes, would render Kwak inoperable or otherwise unsuitable for its intended purpose, we conclude that there has not been convincing evidence presented on this record to support such an argument. Nor will we engage in this inquiry here in the first instance on appeal. We do note, however, that the insulation regions essentially define the shape of the oxidation aperture which, in turn, determines the shape of light emission. See Kwak, col. 1, ll. 21-23; col. 2, ll. 33-36; Fig. 2c. On this record, we see no error in the Examiner‟s conclusion that it would have been obvious to remove at least some of the insulation material and yet still define an aperture for light emission. Nor are we persuaded of error in the Examiner‟s mapping Kwak‟s insulation film 160 to the recited protective layer for the reasons indicated by the Examiner. Ans. 4, 12-17. First, Appellant provides no persuasive evidence on this record proving that Kwak‟s silicon dioxide film 160 would Appeal 2010-002724 Application 10/892,983 8 be incapable of functioning as a protective layer as claimed. We reach this conclusion noting, as does the Examiner (Ans. 14-16), that protection from humidity is not recited in claim 1. Appellant‟s arguments in that regard (App. Br. 38-40; Reply Br. 25-26) are therefore not commensurate with the scope of the claim. But even if a humidity-protection layer were recited in claim 1 (which it is not) and silicon dioxide was incapable of functioning as such a layer as Appellant asserts (a finding that has not been made on this record in any event), that alone is hardly persuasive of error. As the Examiner correctly indicates, silicon dioxide is not the only suitable material for the insulation film in view of Kwak‟s permissive and open-ended language in this regard. See Ans. 16 (citing Kwak, col. 5, ll. 54-59). We are therefore not persuaded that the Examiner erred in rejecting representative claim 1, and claims 2-4 and 8-10 not separately argued with particularity. THE OBVIOUSNESS REJECTION OVER KWAK, ZHU, AND MAEGAWA We likewise sustain the Examiner‟s obviousness rejection of claims 6 and 7 over Kwak, Zhu, and Maegawa for the reasons indicated by the Examiner. Ans. 5-6, 17-22. Appellant reiterates similar arguments made in connection with claim 1 and adds that Maegawa fails to cure those purported deficiencies. App. Br. 29-31, 41-45; Reply Br. 29-36. We are not persuaded by these arguments, however, for the reasons previously discussed and those indicated by the Examiner. Nor does Appellant persuasively rebut the Examiner‟s finding that Maegawa‟s oxidation process forms a layer of SiON from a layer of SiN. Ans. 18-19. Appeal 2010-002724 Application 10/892,983 9 We are therefore not persuaded that the Examiner erred in rejecting claims 6 and 7. THE OBVIOUSNESS REJECTION OVER KWAK, ZHU, AND COMIZZOLI Regarding claim 5, the Examiner finds that Kwak and Zhu do not disclose that the first dielectric protective layer‟s thickness is less than about 6000 Å, but cites Comizzoli as teaching this feature in concluding that the claim would have been obvious. Ans. 6, 22-28. The Examiner reaches this conclusion noting optimizing the dielectric layer‟s thickness by routine experimentation would have been obvious in view of (1) Comizzoli‟s teaching that protection layer thickness is a critical parameter, and (2) Comizzoli‟s forming a passivation layer less than about 0.6 microns. Ans. 25-26, 28. Appellant reiterates similar arguments made in connection with claim 1 and adds that Comizzoli fails to cure those purported deficiencies. App. Br. 46-50; Reply Br. 36-43. The issue before us, then, is as follows: ISSUE 1. Under § 103, has the Examiner erred in rejecting claim 5 by finding that Kwak, Zhu, and Comizzoli collectively would have taught or suggested the first dielectric protective layer‟s thickness is less than about 6000 Å? 2. Is the Examiner‟s reason to combine the teachings of these references supported by articulated reasoning with some rational underpinning to justify the Examiner‟s obviousness conclusion? Appeal 2010-002724 Application 10/892,983 10 ANALYSIS We sustain the Examiner‟s obviousness rejection of claim 5 over Kwak, Zhu, and Comizzoli for the reasons indicated by the Examiner. Ans. 6, 22-28. We add that Appellant‟s argument regarding the lack of result- effective variables (App. Br. 48; Reply Br. 38) is unavailing. Leaving aside the fact that this argument is somewhat contradictory in that it alleges that the exemplary VCSEL result-effective variables “are not known to be result effective” (id.) (emphases added), it does not squarely address the Examiner‟s position which is based on optimizing the dielectric layer‟s thickness in light of Comizzoli (Ans. 25-26, 28)—a thickness that is likewise disclosed in at least claim 13 of that reference. 7 Ans. 25-26, 28 (citing Comizzoli‟s claim 13). We also find the Examiner‟s reason to combine the teachings of Kwak, Zhu, and Comizzoli (Ans. 6, 26, 28) is supported by articulated reasoning with some rational underpinning to justify the Examiner‟s obviousness conclusion, at the least to the extent that ordinarily skilled artisans would recognize that varying the thickness of a dielectric layer would likewise affect its ability to protect underlying structures. Thicker layers would predictably yield more protection than thinner ones—a common-sense principle readily apparent to ordinarily skilled artisans. 8 But skilled artisans would also understand that minimizing layer thickness 7 Comizzoli‟s claim 13 recites that the passivating coating has a thickness in the range 0.1 to 0.6 μm (i.e., 1000 to 6000 Å). Comizzoli, col. 10, ll. 7-8. 8 See KSR Int’l Co. v. Teleflex, Inc., 550 U.S. 398, 421 (2007) (“Rigid preventative rules that deny factfinders recourse to common sense . . . are neither necessary under our case law nor consistent with it.”). Appeal 2010-002724 Application 10/892,983 11 would, among other things, reduce manufacturing costs by requiring less material for the dielectric layer. Given these fundamental engineering principles, we see no reason why reducing layer thickness to less than 6000 Å as claimed, yet maintaining at least some protective layer qualities merely optimizes result- effective variables as the Examiner suggests—namely thickness and protection. See In re Boesch, 617 F.2d 272, 276 (CCPA 1980); see also In re Aller, 220 F.2d 454, 456 (CCPA 1955). Such an engineering tradeoff is well within the level of ordinarily skilled artisans. We are therefore not persuaded that the Examiner erred in rejecting claim 5. CONCLUSION The Examiner did not err in rejecting claims 1-10 under § 103. ORDER The Examiner‟s decision rejecting claims 1-10 is affirmed. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1)(iv). AFFIRMED kis Copy with citationCopy as parenthetical citation