Ex Parte KimDownload PDFPatent Trial and Appeal BoardFeb 10, 201713122964 (P.T.A.B. Feb. 10, 2017) Copy Citation United States Patent and Trademark Office UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O.Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 13/122,964 04/06/2011 Yong Hwan Kim 34975-00001 4011 124602 7590 Polsinelli PC 1401 EYE ST NW SUITE 800 WASHINGTON, DC 20005-2225 EXAMINER WIECZOREK, MICHAEL P ART UNIT PAPER NUMBER 1712 NOTIFICATION DATE DELIVERY MODE 02/14/2017 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address(es): SMosiolek@Polsinelli.com Lee @polsinelli. com DC -IPDocketing @ Polsinelli. com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte YONG HWAN KIM Appeal 2016-000374 Application 13/122,9641 Technology Center 1700 Before CHUNG K. PAK, CHRISTOPHER L. OGDEN, and MONTE T. SQUIRE, Administrative Patent Judges. OGDEN, Administrative Patent Judge. DECISION ON APPEAL Appellant appeals under 35 U.S.C. § 134(a) from the Examiner’s decision2 finally rejecting claims 1—12 in the above-identified application. We have jurisdiction pursuant to 35 U.S.C. § 6(b). We AFFIRM. 1 Appellant identifies INFOVION, Inc. as the real party in interest. Appeal Br. 2, Mar. 23,2015. 2 Final Office Action, Sept. 22, 2014 [hereinafter Action]; Examiner’s Answer, July 9, 2015 [hereinafter Answer], Appeal 2016-000374 Application 13/122,964 BACKGROUND Appellant’s invention relates to “a method for manufacturing a transparent anode by forming a thin film for the transparent oxide electrode on a substrate and post-treating the thin film for the transparent anode using an irradiation of an electron beam to the surface of the thin film for the transparent oxide electrode to thereby improve performance of the electrode.” Spec. 11. Sole independent claim 1 is representative: 1. A method for manufacturing a transparent oxide electrode using an electron beam post-treatment comprising: (a) forming a thin film for the transparent oxide electrode on a substrate; and (b) irradiating an electron beam with a beam energy of 100 eV to 500 eV onto a surface of the thin film for 5 to 10 minutes such that sheet resistance of the thin film is decreased. Appeal Br. 10 (emphasis added). The Examiner maintains the following grounds of rejection3: I. Claims 1—3, 5—7, and 10 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Yamamoto.4 See Action 4—5. II. Claim 4 is rejected under 35 U.S.C. § 103(a) as being unpatentable over Yamamoto, and further in view of Kishimoto.5 See Action 6. 3 In the Answer, the Examiner withdrew a rejection of claims 1—12 under 35 U.S.C. § 112, 1st paragraph, as failing to comply with the written description requirement. See Answer 2. 4 Yamamoto et al., U.S. Patent No. 5,413,959 (issued May 9, 1995). 5 Kishimoto et al., U.S. Patent No. 6,242,686 B1 (issued June 5, 2001). 2 Appeal 2016-000374 Application 13/122,964 III. Claims 8 and 9 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Yamamoto, and further in view of Ohnishi.6 See Action 6-7. IV. Claims 11 and 12 are rejected under 35 U.S.C. § 103(a) as being unpatentable over Yamamoto, and further in view of Wakalopulos.7 See Action 7—8. In the Appeal Brief, Appellant specifically addresses rejection I as it relates to claim 1, and argues that dependent claims 2, 3, 5—7, and 10 are allowable for the same reasons. See Appeal Br. 8—9. Appellant relies on the same arguments in response to rejections II—IV, while arguing that Kishimoto, Ohnishi, and Wakalopolus fail to remedy the alleged deficiency of the rejection of claim 1. Because Appellant only addresses the substance of the Examiner’s rejection of claim 1 as the basis for this appeal, we limit our discussion to claim 1. Claims 2—12 stand or fall with claim 1. DISCUSSION Yamamoto describes “a method of modifying a transparent conductive oxide film,” in which the film “is irradiated with an energy beam for increasing the carrier concentration and thereby reducing the resistance of the transparent conductive oxide film.” Yamamoto Abstract. In the examples described in Yamamoto, the energy beam is a laser beam; however, Yamamoto teaches that “the present invention is not restricted to a 6 Ohnishi, U.S. Patent No. US 6,912,031 B2 (issued June 28, 2005). 7 Wakalopulos, U.S. Patent No. 3,970,892 (issued July 20, 1976). 3 Appeal 2016-000374 Application 13/122,964 laser beam but another energy beam such as an electron beam is also employable.” Id. at 10:35—37. The Examiner finds that Yamamoto teaches all the limitations of claim 1, except that the reference “does not specifically teach that the beam had an energy in the range of 100 eV to 500 eV for a duration of 5 to 10 minutes.” Action 4. However, the Examiner finds that “Yamamoto does teach that the energy of the beam affected the decrease in sheet resistance.” Id. (citing Yamamoto 5:3—36, Figs. 1, 2). The Examiner also finds that “the energy of the energy beam and duration of irradiation were relevant process parameters affecting the decrease in sheet resistance of the oxide film,” and that “[o]ne of ordinary skill in the art would have recognized that the energy and duration of irradiation of the energy beam itself was relevant and would have applied these teachings to the specific types of energy beams taught by Yamamoto which included electron beams.” Answer 3. Thus, the Examiner determines that “it would have been obvious to one having ordinary skill in the art to have determined optimal beam energy and irradiation duration through routine experimentation because these factors affected the decrease in sheet resistance of the film.” Action 5 (citing In reAller, 220 F.2d 454, 456 (CCPA1955)). Appellant argues that [ujnlike the presently claimed invention, Yamamoto et al. is not directed toward the use of an electron beam. Instead, Yamamoto et al. is only directed toward a laser. Further, Yamamoto et al. has no disclosure with regard to the beam energy of an electron beam, much less the duration of an electron beam on a thin film. Any assertion that a laser, which is a stream [of] photons, is the same as an electron beam, which is a stream of electrons, is just wrong. In other words, the laser of Yamamoto et al. provides no 4 Appeal 2016-000374 Application 13/122,964 basis of teaching with regard to the claimed electron beam of the presently claimed invention. Appeal Br. 8—9. Appellant’s argument does not persuade us that the Examiner reversibly erred in rejecting claim 1. Yamamoto explicitly teaches that the disclosed method may be performed using either an electron beam or a laser beam as its energy beam. Yamamoto 10:34—37. Implicit in this teaching is that Yamamoto’s discussion of the effect of the beam energy and duration of an energy beam, such as a laser beam, on the film resistance is also applicable to an electron beam identified as an alternative energy beam. Yamamoto 5:3—36, 10:34—37. Furthermore, Appellant does not direct us to any evidence rebutting the Examiner’s finding that beam energy and duration were known at the time of filing to affect the resistance of the film, and that a person of ordinary skill in the art would have had the ability and motivation to determine the optimal energy and duration of an electron beam, as specified by claim 1, through routine experimentation. Thus, we find no ground to reverse the Examiner’s decision to reject claim 1. For the same reasons, we are not persuaded of reversible error in the Examiner’s rejection of claims 2—12. DECISION The Examiner’s decision is affirmed. No time period for taking any subsequent action in connection with this appeal maybe extended. See 37 C.F.R. § 1.136(a)(l)(iv) (2016). AFFIRMED 5 Copy with citationCopy as parenthetical citation