Ex parte HillDownload PDFBoard of Patent Appeals and InterferencesAug 10, 200108669794 (B.P.A.I. Aug. 10, 2001) Copy Citation The opinion in support of the decision being entered today was not written for publication and is not binding precedent of the Board. Paper No. 15 UNITED STATES PATENT AND TRADEMARK OFFICE _____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES _____________ Ex parte RODNEY L. HILL _____________ Appeal No. 1998-2582 Application No. 08/669,794 ______________ ON BRIEF _______________ Before CAROFF, KRATZ and DELMENDO, Administrative Patent Judges. CAROFF, Administrative Patent Judge. DECISION ON APPEAL This decision on appeal relates to the examiner’s final rejection of claims 12-17, all the claims now pending in appellant’s application. The claims are directed to a method of processing semiconductor wafers having an exposed aluminum-containing layer. The method includes the step of rinsing the wafers Appeal No. 1998-2582 Application No. 08/669,794 2 with deionized (DI) water which has been purified by being subjected to air Appeal No. 1998-2582 Application No. 08/669,794 3 injection followed by degasification to reduce the concentration of dissolved oxygen (DO) in the water. Claim 12, the sole independent claim, is representative: 12. A method of processing semiconductor wafers having an exposed metal layer including aluminum formed thereon, comprising the steps of: deionizing water, prior to use of the deionized water for processing of the semiconductor wafers, injecting air into the deionized water, thereby to remove carbon dioxide from the deionized water; passing the water with the injected air through a degasifier unit, thereby reducing a concentration of oxygen gas that was dissolved in the water due to the step of injecting air; and rinsing the semiconductor wafers having the exposed metal layer with the degasified water, thereby reducing any etching or pitting of the exposed metal layer by oxygen gas in the water. All of the claims on appeal stand rejected for obviousness under 35 U.S.C. § 103 in view of the admitted prior art disclosed in appellant’s specification (pages 1-4) taken in combination with the following prior art reference: Hirofuji 5,422,013 Jun. 6, 1995 Based upon the record before us, we agree with appellant Appeal No. 1998-2582 Application No. 08/669,794 4 that the examiner has failed to establish a prima facie case of obviousness. Accordingly, we shall reverse the sole rejection at issue essentially for the reasons discussed in appellant’s brief. Hirofuji relates to a method for purifying water to be used in a process for manufacturing semiconductor devices. In Hirofuji, water is passed in sequence through a deaerator, an oxidation device, an ion eliminating device and a particle eliminating device. Appellant acknowledges that it was a well known problem in the semiconductor field that DI water undesirably etches aluminum and aluminum alloys. Appellant also acknowledges that it was common practice to subject DI water to injection of air to remove dissolved carbon dioxide. Apparently, appellant was the first to recognize that the problematic etching of aluminum caused by DI water was not due to the DI water itself but rather to the DO content of the DI water. While Hirofuji (col. 1, ll. 25-29) suggests that reduction of DO content may be desirable, this suggestion does not arise in the particular context of a purification process which involves an air injection step, as recited in the Appeal No. 1998-2582 Application No. 08/669,794 5 instant claims, where DO is necessarily present at relatively high levels. Neither does Hirofuji particularly relate to the rinsing of semiconductor wafers which have an exposed metal layer including aluminum, the operational area where the problem addressed by appellant arises. Thus, we find there would be no motivation to combine the teachings of Hirofuji with the admitted prior art in a way which would render the claimed process obvious within the purview of 35 U.S.C. § 103. In a nutshell, the examiner has not given due regard to the principle that patentability may reside in the discovery of the source of a problem even though the remedy may be obvious once the source of the problem is identified. See In re Sponnoble, 405 F.2d 578, 585, 160 USPQ 237, 243 (CCPA 1969); and Eibel Process Co. v. Minnesota & Ontario Paper Co., 261 U.S. 45, 67-68, 1923 CD 623, 639-40 (1923). Appeal No. 1998-2582 Application No. 08/669,794 6 For the foregoing reasons, the decision of the examiner is reversed. REVERSED MARC L. CAROFF ) Administrative Patent Judge ) ) ) ) BOARD OF PATENT PETER F. KRATZ ) APPEALS AND Administrative Patent Judge ) INTERFERENCES ) ) ) ROMULO H. DELMENDO ) Administrative Patent Judge ) MLC:hh Appeal No. 1998-2582 Application No. 08/669,794 7 SKJERVEN MORRILL MACPHERSON, LLP 25 Metro Drive Suite 700 San Jose, CA 95110 Copy with citationCopy as parenthetical citation