Ex Parte DeatonDownload PDFBoard of Patent Appeals and InterferencesJun 13, 201110949041 (B.P.A.I. Jun. 13, 2011) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE ____________________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________________ Ex parte CRAIG F. DEATON ____________________ Appeal 2009-008271 Application 10/949,041 Technology Center 2100 ____________________ Before ST. JOHN COURTENAY III, THU A. DANG, and DEBRA K. STEPHENS, Administrative Patent Judges. DANG, Administrative Patent Judge. DECISION ON APPEAL Appeal 2009-008271 Application 10/949,041 2 I. STATEMENT OF CASE Appellant appeals the Examiner’s second rejection of claims 1-19 under 35 U.S.C. § 134(a). We have jurisdiction under 35 U.S.C. § 6(b). We affirm. A. INVENTION According to Appellant, the invention relates to the development and testing of new complex semiconductor products and more specifically for testing the “correctness” of the logic or verification environment before the product or device is released and available for testing (Spec. 1, ¶ [0002]). B. ILLUSTRATIVE CLAIM Claim 1 is exemplary and reproduced below: 1. A method of testing the correct operation of the logic environment associated with a selected device or component comprising the steps of: providing a virtual device or component representative of said selected device, said virtual device for receiving input logic signals and for providing output logic signals; generating signals representative of selected logic inputs to said selected device and providing said logic inputs to said virtual device; monitoring selected logic outputs and said selected logic inputs of said virtual device; predicting said selected logic outputs of said selected device as a function of said selected logic inputs; Appeal 2009-008271 Application 10/949,041 3 driving said selected logic outputs to be the same as said predicted logic outputs; and comparing said monitor of logic outputs to said predicted logic outputs to determine if they are the same. C. REJECTIONS The prior art relied upon by the Examiner in rejecting the claims on appeal is: West US 5,475,624 Dec. 12, 1995 Claims 1-19 stand rejected under 35 U.S.C. § 102(b) as being anticipated by West. II. ISSUE Has the Examiner erred in finding that West teaches “comparing said monitor of logic outputs to said predicted logic outputs to determine if they are the same” (claim 1)? III. FINDINGS OF FACT The following Findings of Fact (FF) are shown by a preponderance of the evidence. West 1. West discloses creating two emulations of a logic circuit, one of which is a “good” model containing no faults and the other of which is a “faultable” model into which possible faults may be selectively introduced (col. 4, ll. 45-48). Appeal 2009-008271 Application 10/949,041 4 2. The device output signals 735 of “good” device emulation 705 are combined with the device output signals 830 of “faulted” device emulation 815 in an exclusive-OR operation by XOR gate 835 to produce a comparison signal 840 (col. 8, l1. 4-14; Fig. 8). IV. ANALYSIS For all of claims 1-19, Appellant merely repeats the language of claims 1 and 11, merely states that the prior art “teaches comparing the device output of good device emulation with device output signals of faulted device emulation” and makes a statement that the cited reference “does not show, teach, or suggest the above recited limitations of claims 1 and 11” (App. Br. 11). The Examiner finds that “inputs to and outputs from a logic circuit, such as taught by West, make up logic inputs and logic outputs, as claimed” wherein “any output from a logic device is a logic output” (Ans. 7). According to the Examiner, “West does teach that the ‘faultable’ model is monitored; in that, the model outputs are collected and compared with the ‘good’ model outputs to see if a difference is detected” wherein “the ‘good’ outputs of West must be correct and this knowledge must be known beforehand” (Ans. 8). We find no error in the Examiner’s findings. First, we find that Appellant’s statement which merely points out what a claim recites will not be considered an argument for separate patentability of the claim. See 37 C.F.R. § 41.37(c)(1)(vii). Moreover, Appellant’s mere statement that the reference does not disclose the recited claim language but that is unsupported by factual evidence is entitled to little probative value. In re Geisler, 116 F.3d 1465, 1470 (Fed. Cir. 1997); see also In re De Appeal 2009-008271 Application 10/949,041 5 Blauwe, 736 F.2d 699, 705 (Fed. Cir. 1984); and Ex parte Belinne, No. 2009-004693, 2009 WL 2477843 at *3-4 (BPAI Aug. 10, 2009) (informative). Accordingly, we find that, by merely pointing out what the claim recites and making a conclusory statement that the reference does not disclose the recited claim language without support by factual evidence (App. Br. 11) in response to the Examiner’s detailed findings (Ans. 7-8), Appellant has not shown error in the Examiner’s findings. Furthermore, we find no error in the Examiner’s finding that West teaches “comparing said monitor of logic outputs to said predicted logic outputs to determine if they are the same” (claim 1 and similarly recited in claim 11). In particular, we give the claims their broadest reasonable interpretation consistent with the Specification without reading limitations from the Specification into the claims. See In re Bigio, 381 F.3d 1320, 1324 (Fed. Cir. 2004) and In re Van Geuns, 988 F.2d 1181, 1184 (Fed. Cir. 1993). Claim 1 (or similarly recited claim 11) does not place any limitation on what the term “monitor of logic outputs” or “predicted logic outputs” means other than the two outputs are compared “to determine if they are the same.” Thus, we give “monitor of logic outputs” its broadest reasonable interpretation as outputs related to a logic circuit that is being monitored. Similarly, we interpret “predicted logic outputs” as outputs related to a logic circuit that is known beforehand. West discloses creating a “good” model of a logical circuit containing no faults and a “faultable” model of the logical circuit into which possible faults may be selectively introduced (FF 1), wherein the output signals of “good” model is compared with the output signals of “faultable” model (FF 2). We find the output signals of the models of the logical circuit to be Appeal 2009-008271 Application 10/949,041 6 “logic outputs,” and thus find the “predicted logic outputs” to read on West’s “good” model outputs that are known beforehand (and are predetermined to be without faults). That is, we agree with the Examiner that “the ‘good’ outputs of West must be correct and this knowledge must be known beforehand” (Ans. 8). Furthermore, we find no error in the Examiner’s finding that “West does teach that the ‘faultable’ model is monitored; in that, the model outputs are collected and compared with the ‘good’ model outputs to see if a difference is detected” (id.). That is, we find no error in the Examiner’s finding that the “monitor of logic outputs” to read on West’s “faultable” model outputs that are being monitored. Accordingly, we find no error in the Examiner’s finding that representative claim 1, independent claim 11 falling therewith, and claims 2- 10 and 12-19 depending respectively therefrom are anticipated by West. V. CONCLUSION AND DECISION The Examiner’s decision rejecting claims 1-19 under 35 U.S.C. § 102(b) is affirmed. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1)(iv). AFFIRMED peb Copy with citationCopy as parenthetical citation