Ex Parte Cross et alDownload PDFBoard of Patent Appeals and InterferencesFeb 28, 201210323272 (B.P.A.I. Feb. 28, 2012) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 10/323,272 12/18/2002 Elfido Cross JR. 2162.097800/TT5243 7506 10742 7590 02/28/2012 GLOBALFOUNDRIES INC. c/o Williams, Morgan & Amerson 10333 Richmond , Suite 1100 Houston, TX 77042 EXAMINER RIAD, AMINE ART UNIT PAPER NUMBER 2113 MAIL DATE DELIVERY MODE 02/28/2012 PAPER Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE ____________________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________________ Ex parte ELFIDO CROSS JR., ERNEST D. ADAMS III, ROBERT J. CHONG, HOWARD E. CASTLE, THOMAS J. SONDERMAN, and ALEXANDER J. PASADYN ____________________ Appeal 2010-001756 Application 10/323,272 Technology Center 2100 ____________________ Before JOSEPH L. DIXON, THU A. DANG, and ANDREW J. DILLON, Administrative Patent Judges. DANG, Administrative Patent Judge. DECISION ON APPEAL Appeal 2010-001756 Application 10/323,272 2 I. STATEMENT OF THE CASE Appellants appeal under 35 U.S.C. § 134(a) from a Final Rejection of claims 1-22. We have jurisdiction under 35 U.S.C. § 6(b). We affirm-in-part. A. INVENTION Appellants’ invention relates generally to an industrial process and, more particularly, to performing fault detection in parallel in a semiconductor fabrication process (Spec. 2, ll. 4-5). B. ILLUSTRATIVE CLAIM Claim 1 is exemplary: 1. A method, comprising: receiving first data associated with processing of a workpiece by a first processing tool; receiving second data associated with processing of a workpiece by a second processing tool; and comparing at least a portion of at least one of the first received data and the second received data to a fault model common to both of the processing tools to determine if a fault associated with at least one of the processing of the workpiece by the first processing tool and processing of the workpiece by the second processing tool occurred. C. REJECTION The prior art relied upon by the Examiner in rejecting the claims on appeal is: Appeal 2010-001756 Application 10/323,272 3 Coss US 6,954,883 B1 Oct. 11, 2005 (filed Jan. 11, 2002) Claims 1-22 stand rejected under 35 U.S.C. § 102(e) as being anticipated by Coss. II. ISSUE The dispositive issue before us is whether the Examiner has erred in finding that Coss teaches receiving “first data” from “a first processing tool,” receiving “second data” from “a second processing tool” and “comparing at least a portion of at least one of the first received data and the second received data to a fault model common to both the processing tools to determine if a fault associated with at least one of the processing of the workpiece … occurred” (claim 1, emphasis added). In particular, the issue turns on whether Coss teaches comparing a portion of data from at least one of two processing tools with a model common to both processing tools to determine if a fault associated with the processing has occurred. III. FINDINGS OF FACT The following Findings of Fact (FF) are shown by a preponderance of the evidence. Coss 1. Coss discloses performing fault detection using real-time or near real- time data from a database (Abstract). 2. Coss’s Figure 6 is reproduced below: App App Cos sign and on t and met proc ana inte data faul data eal 2010-0 lication 10 s’s Figure als on line processed he line 62 processed rology dat essing too lysis unit 6 grated met base 320 f t detection from the 01756 /323,272 6 disclose 623 that a by the fir 3 that are i by the sec a are colle ls 610a an 60 sends m rology too or storage unit 670 f database 3 s a compu re intende st machine ntended fo ond mach cted by the d 610b (co etrology l 310 and ; and data or perform 20 (col. 7, 4 ter system d for proc interface r processi ine interfa integrate l. 7, ll. 49 data and o the offline from the d ing fault l. 62 to co 630 wher essing too 615a and c ng tool B ce 615b (c d metrolog -51); the m ffline met metrolog atabase 32 detection a l. 8, l. 8). ein contro l A 610a a ontrol inp 610b are re ol. 7, ll. 32 y tool 310 etrology rology dat y tool 650 0 are extr nalysis ba l input re receive ut signals ceived -38); within th data a from the to the acted by a sed upon d e Appeal 2010-001756 Application 10/323,272 5 IV. ANALYSIS Claims 1, 5, 6, and 15-17 Appellants contend that Coss does not teach “the claimed feature of comparing data received from processing tool(s) to a common fault model (that is, a fault model common to the first processing tool and second processing tool)” as required by claim 1 (App. Br. 5). According to Appellants, “Coss discloses determining fault detection using parameters particular to that processing step, and not based on conditions, calculations, and/or expectations that are common to the processing steps of both the processing tools A & B” (App. Br. 7). In particular, though Appellants admit that, in Coss, “the fault detection is based on values that are particular to the processing step being performed on the wafer by processing tool A and processing tool B,” Appellants assert that the comparison is “not based on any values (or threshold values) common to different processing steps” (App. Br. 6). Further, Appellants contend that Coss “does not use a common fault model … to determine faults” (App. Br. 7), but rather “the ‘fault detection analysis’ is performed to calculate or detect faults even before any ‘threshold value’ is ever utilized” (App. Br. 7-8). However, the Examiner explains that, in Coss, “[t]he criterias [sic] for the two processing tools are the same,” “the data collected at the database level comes [from] both processing tools” and thus “it is logical to come to the conclusion that the manufacturing model is the base of the comparison between the data stored in the database and the recipe through item 670 (Figure 6; fault detection unit)” (Ans. 9). The Examiner finds that “the Appeal 2010-001756 Application 10/323,272 6 recipe is common because the manufacturing parameters cannot change from one wafer to the other” (id.). Although Appellants contend that Coss does not teach determining fault detection “based on conditions, calculations, and/or expectations that are common to the processing steps of both the processing tools A & B” (App. Br. 7), such argument is not commensurate in scope with the language of claim 1. That is, claim 1 does not require any such “conditions, calculations, and/or expectations that are common to the processing steps” (id., emphasis added), as Appellants argue. Rather, claim 1 merely requires “a fault model” that is “common to both of the processing tools” (emphasis added). In determining whether Coss teaches receiving “first data” from “a first processing tool,” receiving “second data” from “a second processing tool” and “comparing at least a portion of at least one of the first received data and the second received data to a fault model common to both the processing tools” as specifically recited in representative claim 1, we give the claim its broadest reasonable interpretation consistent with the Specification. See In re Morris, 127 F.3d 1048, 1054 (Fed. Cir. 1997). However, we will not read limitations from the Specification into the claims. In re Van Geuns, 988 F.2d 1181, 1184 (Fed. Cir. 1993). Claim 1 does not place any limitation on what the term “fault model” means, includes, or represents other than a portion of the received data is compared to the model, wherein the model is common to both of the processing tools. Thus, we give “fault model” its broadest but reasonable interpretation as standard parameters common to processing tools, to which received data is compared, as defined in the claim. Furthermore, since claim Appeal 2010-001756 Application 10/323,272 7 1 only defines a “fault” as “associated with” the processing of the workpiece, we give the limitation “to determine … a fault associated with … the processing of the workpiece” its broadest but reasonable interpretation as determining any undesirable variation from standard values related in any way to the processing of a workpiece. Coss discloses performing fault detection (FF 1) wherein data from processing tools 610a and 610b are sent to the database and then extracted by a fault detection unit for performing fault detection analysis (FF 2). We find Coss’s data received from processing tool 610a to comprise “first data” and data received from processing tool 610b to comprise “second data,” wherein at least a portion of the received data is retrieved from the database and received by the fault detection unit for fault detection analysis. In Coss, the received data from the tools is examined by the fault detection unit to determine whether there is fault (FF 1). We find such examination for fault to comprise comparing the received data with such standard parameters to determine if there is fault. That is, in order for the fault detection unit to determine there is fault, the data must necessarily be examined in comparison to standard parameters to determine if there is any undesirable variation. In fact, even Appellants admit that, in Coss, “the fault detection is based on values that are particular to the processing step being performed on the wafer by processing tool A and processing tool B” (App. Br. 6, emphasis added). That is, we find Coss discloses determining whether there’s any undesirable variation from standard values particular to the processing step. In view of our broad but reasonable claim interpretation above, we find Coss discloses comparing at least a portion of at least one of Appeal 2010-001756 Application 10/323,272 8 the “first received data” and the “second received data” to a “fault model” as required by claim 1. Since the processing step is performed by both processing tools A and B, we find the standard values particular to the step to be “common” to the processing tools, as required by claim 1. In fact, we find no error in the Examiner’s finding that the criteria for the two processing tools “are the same” and that “manufacturing parameters cannot change from one wafer to the other” (Ans. 9). In view of our broad but reasonable interpretation above, we find Coss to disclose a fault model “common” to both the processing tools. Further, since Coss’s standard values are particular to the processing step being performed on the wafer, we find that any variation from the standard values determined in Coss to be related to the processing step. In view of our broad but reasonable claim interpretation, we find Coss to disclose determining a fault “associated with” the processing of the workpiece. Accordingly, we agree with the Examiner that Coss discloses “comparing at least a portion of at least one of the first received data and the second received data to a fault model common to both of the processing tools to determine if a fault associated with at least one of the processing of the workpiece … occurred” as required by claim 1. In view of the record, we find that Appellants have not shown that the Examiner erred in rejecting representative claim 1, independent claims 15 and 16 falling therewith (App. Br. 7), and claims 5, 6, and 17 depending respectively from claims 1 and 16 over Coss. Appeal 2010-001756 Application 10/323,272 9 Claims 8, 9, 21, and 22 As for independent claim 8, Appellants repeat the argument that “Coss does not teach detecting a fault using a ‘fault model’ that is representative of at least two processing tools” and add that “Coss does not teach that the threshold value represents an acceptable operational range” (App. Br. 9). However, the Examiner points out that “it is not possible, for fault detection unit to detect fault if it does not have a certain way of knowing that there is an error or an error occurred” (Ans. 10). We agree with the Examiner. As discussed above, we find Coss discloses standard values “common” to both the processing tools that are used to determine whether there is any undesirable variation from these standard values. Thus, we find Coss to disclose standard values that are representative of acceptable operations by both processing tools, i.e., “at least two processing tools,” as recited in claim 8. Since claim 8 does not define as to what is an “acceptable operational range,” we give the term its broadest but reasonable definition as any operational range outside of which there is an unacceptable/undesirable variation. That is, we agree with the Examiner that “it is not possible, for fault detection unit to detect fault if it does not have a certain way of knowing that there is an error or an error occurred” (Ans. 10). Thus, we find Coss’s “fault model” comprises the operational range outside of which there is an unacceptable variation/fault. Thus, in view of our broad but reasonable interpretation, we find Coss discloses “a fault model representative of an acceptable operational range of at least the first and second processing tools” as required by claim 8. Appeal 2010-001756 Application 10/323,272 10 Accordingly, we also find that Appellants have not shown that the Examiner erred in rejecting claim 8 and claim 21, falling therewith, and claims 9 and 22 depending respectively therefrom (App. Br. 9) over Coss. Claims 2, 3, 10, 11, 18, and 19 As for claim 2, Appellants also contend that, in Coss, “there is not a single suggestion that a plurality of fault models is used for fault detection, much less a plurality of common fault models” (App. Br. 9). However, as discussed above, we find Coss discloses standard values [i.e., more than one value] “common” to both of the processing tools that are used to determine whether there is any detraction from these standard values. That is, we find Coss discloses a “plurality” of common standard values used for fault detection. Thus, we see no error in the Examiner’s finding that Coss discloses “a plurality of common fault models” are required by claim 1. Accordingly, we also find that Appellants have not shown that the Examiner erred in rejecting claim 2 and claim 10 and 18, falling therewith, and claims 3, 11, and 19 depending respectively therefrom (App. Br. 9) over Coss. Claims 4, 7, 12-14, and 20 As for claims 4, 13, and 20, Appellants contend that Coss does not disclose “processing of a workpiece by a third processing tool” (App. Br. 10). Appellants contend that “the clause ‘data acquired on at least one’ [of Coss] (quoted by the Examiner) refers to acquiring data either on a real-time or near real-time basis, and does not describe receiving data from three different processing tools” (App. Br. 9-10). Though the Examiner explains that “it is possible to [have] more than 3 stations” (Ans. 11), the section of Coss cited by the Examiner merely discloses “as the wafers 105 would pass Appeal 2010-001756 Application 10/323,272 11 through other processing stations (not shown) in the processing tool 610” (col. 4, ll. 47-49). That is, this section of Coss merely discloses that the wafer passes through a section of one of two (not three) stations. There is no teaching in this section of Coss that a third station is necessarily included. As for claim 12, Appellants contend that in Coss, “there is simply no teaching of [a] plurality of fault models having a[] hierarchical order” (App. Br. 12). Though the Examiner explains that “fault models according to Coss are contained in the database which is by definition an organized body of related information” (Ans. 6), the sections of Coss cited by the Examiner merely disclose comparing data from the database to standard values. That is, there is no teaching in these cited sections of Coss that the standard values are necessarily arranged in a hierarchical order. As for claims 7 and 14, Appellants contend “claim 7 calls for updating the ‘fault model,’” and thus “the Examiner must now show that Coss teaches updating this so-called ‘threshold’ in Coss’s fault detection system” (App. Br. 13). Appellants contend that the passage cited by the Examiner “does not even relate to fault detection analysis” (id.). Though the Examiner finds that “Coss not only updates the fault model constituted by database 320[,] fault detection unit 670, and manufacturing model 640, but Coss updates it in real time” (Ans. 12), the section of Coss cited by the Examiner merely disclose “[d]ata is acquired on at least one of a real-time basis or near real-time basis”(col. 2, ll. 43-44). That is, this section of Coss merely discloses that data in the database can be updated. However, the fault model cannot be data in the database, since, as Appellants correctly contend, “the claims call for comparing a portion of the received data to a ‘fault model’” Appeal 2010-001756 Application 10/323,272 12 (Reply Br. 11). There is no teaching in Coss that updating the fault models is necessarily included. Since the Examiner has not made a clear distinction as to what teachings of Coss comprise a “third processing tool,” “a hierarchical order” for the fault models, or “updating the fault model based on at least a portion of at least one of the first received data and the received second data” (claim 7), the Examiner has failed to meet the initial burden of proof required for the rejection of claims 4, 7, 12-14, and 20 pursuant to 35 U.S.C. § 102. Accordingly, we are constrained to reverse the Examiner’s rejection of representative claims 4, 7, 12-14, and 20 over Coss. V. CONCLUSION AND DECISION The Examiner’s rejection of claims 1-3, 5, 6, 8-11, 15-19, 21, and 22 under 35 U.S.C. § 102(e) is affirmed. However, the Examiner’s rejection of claims 4, 7, 12-14, and 20 under 35 U.S.C. § 102(e) is reversed. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a)(1)(iv). AFFIRMED-IN-PART peb Copy with citationCopy as parenthetical citation