Ex Parte Boyden et alDownload PDFPatent Trial and Appeal BoardSep 28, 201612011991 (P.T.A.B. Sep. 28, 2016) Copy Citation UNITED STA TES p A TENT AND TRADEMARK OFFICE APPLICATION NO. FILING DATE 12/011,991 01129/2008 44765 7590 09/30/2016 INTELLECTUAL VENTURES - ISF ATTN: DOCKETING, ISF 3150 - 139th Ave SE Bldg.4 Bellevue, WA 98005 FIRST NAMED INVENTOR Edward S. Boyden UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www .uspto.gov ATTORNEY DOCKET NO. CONFIRMATION NO. 0606-002-045-000000 1477 EXAMINER PENG, BO JOSEPH ART UNIT PAPER NUMBER 3768 NOTIFICATION DATE DELIVERY MODE 09/30/2016 ELECTRONIC Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. Notice of the Office communication was sent electronically on above-indicated "Notification Date" to the following e-mail address( es): ISFDocketlnbox@intven.com PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE BEFORE THE PATENT TRIAL AND APPEAL BOARD Ex parte EDWARD S. BOYDEN, GLENN B. FOSTER, RODERICK A. HYDE, MURIEL Y. ISHIKAWA, EDWARD K.Y. JUNG, ERIC C. LEUTHARDT, ROBERT W. LORD, NATHAN P. MYHRVOLD, DENNIS J. RIVET, MICHAEL A. SMITH, CLARENCE T. TEGREENE, THOMAS A. WEA VER, CHARLES WHITMER, LOWELL L. WOOD JR., and VICTORIA Y.H. WOOD Appeal2013-003501 Application 12/011,991 1 Technology Center 3700 Before KEVIN W. CHERRY, BRADLEY B. BAY AT, and AMEE A. SHAH, Administrative Patent Judges. BAY AT, Administrative Patent Judge. DECISION ON APPEAL STATEMENT OF THE CASE Appellants appeal under 35 U.S.C. § 134(a) from the Examiner's final rejection of claims 1-13, 15-39, and 41-53. We have jurisdiction under 35 U.S.C. § 6(b). STATEMENT OF THE DECISION We AFFIRM. 1 Appellants identify "Intellectual Ventures, LLC" as the real party in interest. Appeal Br. 4 (filed Mar. 26, 2012). Appeal2013-003501 Application 12/011,991 CLAIMED INVENTION Appellants' claimed invention is directed to "cauterizing based at least partially on Compton scattered x-ray visualizing, imaging, or information providing." Spec., Title. Claim 1, reproduced below, is illustrative of the subject matter on appeal. 1. A method, comprising: Compton X-ray scattering visualizing, imaging, or information providing within an at least some matter of an at least a portion of an individual responsive to applied X-ray photons; and locating an at least one cauterizing region within the at least some matter of the at least a portion of the individual at least partially responsive to the Compton X-ray scattering visualizing, imaging, or information providing within the at least some matter of the at least the portion of the individual, wherein the locating excludes cauterizing region depths exceeding a penetration depth of the applied X-ray photons. REJECTIONS2 Claims 1---6, 9-33, 36-39, and 41-53 are rejected under 35 U.S.C. § 103(a) as unpatentable over Sahadevan3 and Reiss4 alone or as supplemented by Loo. 5 Claims 1---6, 9-13, 15-33, 36-39, and 41-53 are rejected under 35 U.S.C. § 103(a) as unpatentable over Sahadevan, Hainfeld,6 and Reiss alone or supplemented by Loo. 2 The nonstatutory obviousness-type double patenting rejection over abandoned co-pending application 12/011,641 is rendered moot. 3 Sahadevan, US 5,851,182, iss. Dec. 22, 1998. 4 Reiss et al., US 4,123,654, iss. Oct. 31, 1978. 5 Loo et al., US 5,003,980, iss. Apr. 2, 1991. 6 Hainfeld et al., US 6,995,639 B2, iss. Oct. 18, 2005. 2 Appeal2013-003501 Application 12/011,991 Claims 1---6, 9-13, 15-33, and 36-53 are rejected under 35 U.S.C. § 103(a) as unpatentable over Sahadevan, Hainfeld, Reiss alone or as supplemented by Loo, and Hussein. 7 Claims 7, 8, 34, and 35 are rejected as under 35 U.S.C. § 103(a) as unpatentable over Sahadevan alone or in view of Hainfeld, Reiss alone or supplemented by Loo, and Herr. 8 Claims 7, 8, 34, and 35 are rejected as under 35 U.S.C. § 103(a) as unpatentable over Sahadevan alone of further in view of Hainfeld, Reiss alone or as supplemented by Loo, Hussein and Herr. ANALYSIS Claims 1-9 Appellants argue claims 1-9 as a group. Appeal Br. 14--18. We select claim 1 as representative. Thus, claims 2-9 stand or fall with claim 1. 37 C.F.R. § 41.37(c)(l)(vii). Regarding independent claim 1, the Examiner finds that the limitation of "locating at least one cauterizing region ... wherein the locating excludes cauterizing region depths exceeding a penetration depth of the applied X-ray photons": can be broadly interpreted as disregard a depth of region with modifying adverse condition and/or effects of any matter by an application of energy such as x-rays beyond a penetration depth of applied x-ray photons; or locating such a region with modifying adverse condition and/ or effects of any matter by an application of energy such as x-rays only within a certain penetration depth of applied x-ray photons. 7 Hussein et al., US 6,563,906 B2, iss. May 13, 2003. 8 Herr et al., "A Flying Spot X-Ray System for Compton Backscatter Imaging," pub. 1994. 3 Appeal2013-003501 Application 12/011,991 Answer 15 (mailed Nov. 8, 2012). Thus, the Examiner finds Reiss alone or as supplemented by Loo teaches this limitation. See Answer 18. Appellants contend that the term "penetration depth" has been misconstrued by the Examiner in interpreting the claim. Appeal Br. 1 7; Reply Br. 3 (filed Jan. 8, 2013). In particular, Appellants argue: A person of skill in the art will appreciate that a "penetration depth" of ionizing radiation is a characteristic or typical depth of scattering which varies as a function of energy of the ionizing radiation; individual particles of ionizing radiation can scatter at actual depths that are less then [sic], equal to, or greater than this penetration depth. The Specification's use of the term "penetration depth" is consistent with this ordinary meaning, as seen for example at page 188, lines 11-13: "the penetration depth 170 for visualizing, imaging, and/or information providing may vary as a function of the energy applied to or contained within the applied X-ray." Id. We disagree. Instead, we agree with and adopt the Examiner's findings and response to arguments on pages 5-21 of the Answer as our own. We add the following for emphasis only. We find nothing in the cited passage of the Specification that assigns a meaning to the term "penetration depth" different from, or that otherwise precludes, the Examiner's interpretation. In fact, Appellants only cite part of the sentence from page 188 of the Specification to support their narrow interpretation. The sentence in full indicates that penetration depth may vary as a function of the energy applied, "and/or the frequency, energy level, or other characteristics of the X-ray photons of the applied X-ray 120." Spec., 188:13-14. As such, we decline to narrowly construe the term penetration depth as limited to being a function of energy applied. 4 Appeal2013-003501 Application 12/011,991 Thus, we sustain the rejection of claim 1, as well as claims 2-9, which fall with claim 1. Claims 10--13, 15-39, and 41-53 Appellants provide the same arguments as claim 1 in contesting the rejection of claims 10-13, 15-39, and 41-53. See Appeal Br. 18-29. Accordingly, we sustain the rejections of claims 10-13, 15-39, and 41-53 under 35 U.S.C. § 103(a) for the same reasons as claim 1. DECISION The decision to reject claims 1-13, 15-39, and 41-53 is affirmed. No time period for taking any subsequent action in connection with this appeal may be extended under 37 C.F.R. § 1.136(a). AFFIRMED 5 Copy with citationCopy as parenthetical citation