Ex Parte 5953263 et alDownload PDFBoard of Patent Appeals and InterferencesJan 27, 201290010574 (B.P.A.I. Jan. 27, 2012) Copy Citation UNITED STATES PATENT AND TRADEMARK OFFICE UNITED STATES DEPARTMENT OF COMMERCE United States Patent and Trademark Office Address: COMMISSIONER FOR PATENTS P.O. Box 1450 Alexandria, Virginia 22313-1450 www.uspto.gov APPLICATION NO. FILING DATE FIRST NAMED INVENTOR ATTORNEY DOCKET NO. CONFIRMATION NO. 90/010,574 08/10/2009 5953263 8963.002.RXUS00 8760 22852 7590 01/27/2012 FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP 901 NEW YORK AVENUE, NW WASHINGTON, DC 20001-4413 EXAMINER ESCALANTE, OVIDIO ART UNIT PAPER NUMBER 3992 MAIL DATE DELIVERY MODE 01/27/2012 PAPER Please find below and/or attached an Office communication concerning this application or proceeding. The time period for reply, if any, is set in the attached communication. PTOL-90A (Rev. 04/07) UNITED STATES PATENT AND TRADEMARK OFFICE ____________ BEFORE THE BOARD OF PATENT APPEALS AND INTERFERENCES ____________ Ex parte RAMBUS, INC. ____________ Appeal 2011-013706 Reexamination Control No. 90/010,574 United States Patent 5,953,263 Technology Center 3900 ____________ Before ALLEN R. MacDONALD, KARL D. EASTHOM, and STEPHEN S. SIU, Administrative Patent Judges. EASTHOM, Administrative Patent Judge. DECISION ON APPEAL Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 Appellant, patent owner Rambus, Inc., appeals under 35 U.S.C. §§ 134(b) and 306 from a final rejection of claim 1-4. (App. Br. vii.) We have jurisdiction under 35 U.S.C. §§ 134(b) and 306. We REVERSE. STATEMENT OF THE CASE This proceeding arose from a third party request for ex parte reexamination by Micron Technology Inc., of (now expired) U. S. Patent 5,953,263, “Synchronous Memory Device Having a Programmable Register and Method of Controlling Same.” Appellant’s Brief lists numerous related judicial and other proceedings including inter partes and ex parte reexaminations, International Trade Commission proceedings, and Federal District Court and Circuit Court proceedings. (App. Br. iii-vii.) An oral hearing of this appeal transpired at the BPAI on December 14, 2011. Claim 1 follows: 1. A synchronous semiconductor memory device having at least one memory section which includes a plurality of memory cells, the memory device comprises: a programmable register to store a value which is representative of a delay time after which the memory device responds to a read request. The Examiner rejected claims 1-4 under 35 U.S.C. 102(b) as anticipated based on the iAPX Interconnect Architecture Reference Manual (Intel Corp.) (1982) [hereinafter iAPX Manual]. ISSUE The issue is whether the “synchronous semiconductor memory device” recited in claim 1 reads on the memory module disclosed in the Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 3 iAPX Manual. The central dispute turns on whether the claimed term “synchronous semiconductor memory device” is limited to a single “chip.” FINDINGS OF FACT (FF) The ‘263 Patent P1. The ‘263 patent states that “[o]ne object of the present invention is to use a new bus interface built into semiconductor devices to support high-speed access to large blocks of data from a single memory device”. (Col. 3, ll. 11-14.) P2. The ‘263 patent states that “each semiconductor device contains a set of internal registers” and that “semiconductor devices . . . contain registers 172 which specify the memory addresses contained within that device.” (Col. 6, ll. 18-26.) P3. The ‘263 patent also describes adding the “[n]ew bus interface circuits” to “the internals of prior art DRAM devices.” (Col. 4, ll. 15-16.) The iAPX Manual I1. Figure 1-2 of the iAPX Manual follows: Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 4 Figure 1-2 depicts a memory module comprising a memory storage array and a MCU (Memory Control Unit). “The storage arrays will typically be constructed with high-density dynamic RAM (DRAM) components.” The MCU requires a “modest amount of external logic . . . to interface the MCU to the storage array RAMs - - for simple configurations, as few as 12 external TTL packages are required.” (iAPX Manual 1-4.) I2. The memory module constitutes “a memory confinement area.” (iAPX Manual 1-8, 3-2.) I3. A component level constitutes the lowest level of hardware in the system, an example of which is a RAM chip. A module comprises a group of interconnected components. (iAPX Manual 2-1.) Trade Definitions D1. A “semiconductor memory” is defined as “[a] device for storing digital information that is fabricated by using integrated circuit technology. Also known as integrated circuit memory; large-scale integrated memory; memory chip; semiconductor storage; transistor memory. McGraw-Hill Dictionary of Scientific and Technical Terms 1791 (5 th Ed. Sybil E. Parker 1994). The McGraw-Hill Dictionary also refers to a related definition: “memory chip [s]ee semiconductor memory.” Id. at 1238. D2. A “semiconductor device” is defined as “an electronic component constructed on a small piece of semiconductor (the components on the device are constructed using patterns of insulator or conductor or semiconductor material whose properties can be changed by doping).” Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 5 Dictionary of Computing (A & C Black Ed. 2004) (listing previous editions under copyright to S.M.H. Collin at 1988, 1994, 1998, 2002) avail. at http://www.credoreference.com/entry/acbcomp/semiconductor_device. D3. A “semiconductor device” is also defined as “any of a wide variety of devices that employ the electrical properties of semiconductor materials, such as silicon, to control the flow of electrons; such devices include diodes, photocells, and transistors.” Academic Press Dictionary of Science and Technology (1992) avail. at http://www.credoreference.com/entry/apdst/semiconductor_device. LEGAL PRINCIPLES In reexaminations of non-expired patents, claims are given the “broadest reasonable construction consistent with the specification.” See In re Yamamoto, 740 F.2d 1569, 1571 (Fed. Circ. 1984) (not addressing expired patents). The Federal Circuit has “frequently stated that the words of a claim ‘are generally given their ordinary and customary meaning.’” Phillips v. AWH Corp., 415 F.3d 1303, 1312 (Fed. Cir. 2005) (en banc) (citation omitted), with the caveat that claims “must be read in view of the specification. . . . [T]he specification ‘is always highly relevant to the claim construction analysis. Usually, it is dispositive; it is the single best guide to the meaning of a disputed term.’” Id. at 1315 (citation omitted). Because the meaning of a claim term as understood by persons of skill in the art is often not immediately apparent, and because patentees frequently use terms idiosyncratically, the court looks to “those sources available to the public that show what a person of skill in the art would have understood disputed claim language to mean.”. . . Those sources include “the words of the claims themselves, the remainder of the specification, the prosecution history, and extrinsic evidence concerning relevant Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 6 scientific principles, the meaning of technical terms, and the state of the art.” Id. at 1314 (citation omitted). ANALYSIS Rambus argues generally that a “memory device,” and particularly a “synchronous semiconductor memory device,” as recited in claim 1, are each limited to a single “chip.” (App. Br. 1-2, 14-17.) The general term, “memory device,” is not at issue here even though Rambus devotes considerable discussion to it and the Examiner correctly responds in kind. With respect to the specific term at issue, Rambus maintains that “one of ordinary skill in the art would understand . . . ‘a synchronous semiconductor memory device’ to be a synchronous memory device constructed with semiconductor material” (App. Br. 2) and as such, the iAPX “memory module,” which includes several chips, does not satisfy the claim term (id. at 1-2). (Accord Reply Br. 5 (“The ‘semiconductor’ limitation, which refers to material used to fabricate a chip, further makes clear that a single-chip device is being claimed.”).) Rambus also relies on its expert, Mr. Murphy, who opines that the iAPX’s “collection of 53 separate and distinct integrated circuit devices is not an integrated circuit device, much less a synchronous semiconductor memory device.” (Murphy Decl. ¶ 93 (cited at App. Br. 2).) Apart from the claims, the term “synchronous semiconductor memory device” does not appear to be in the ‘263 patent. However, the ‘263 patent refers to a “semiconductor device[]” as “a single memory device” in terms of “this invention” and refers to “a new bus interface built into Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 7 semiconductor devices.” (P1 (emphasis added).) It also states that “each semiconductor device contains a set of internal registers” and that “semiconductor devices” have “memory addresses contained within that device.” (P2 (emphasis added).) It similarly refers to the interface circuits internal to a DRAM. (P3.) Discussing related patents claiming continuity back to the same application as the patent here (App. No. 07/510,898, filed Apr. 18, 1990), the Federal Circuit defined a similar claim term, “integrated circuit device,” as a “circuit constructed on a single monolithic substrate, commonly called a ‘chip’.” Rambus Inc. v. Infineon Technologies AG, 318 F.3d 1081, 1085-86, 1091 (Fed. Cir. 2003) (citations to trade dictionary definitions to support the plain meaning omitted). The term “semiconductor memory device” is a well-recognized term of art which means a “memory chip.” (D1 (defining “semiconductor memory” as a “memory chip”); accord D2 (defining “semiconductor device” as a component constructed on a small semiconductor piece); D3 (similar definition and also showing examples of such devices which are known as single chip devices (e.g., diodes, transistors).) Similarly, the iRAM handbook at 1-1 states that an engineer using “semiconductor memories had a simple choice of which memory to use. The 2102 Static RAM for ease of use and the 1103 Dynamic RAM for low power were the only devices available.” 1 In a related Rambus reexamination now on appeal to the Federal Circuit (Appeal No. 2010-0011178, Reexamination No. 90/010420), the 1 Memory Components Handbook, Intel. Corp., Ch. 1, 3 (1985) (“iRAM”) (cited in the Request for Ex Parte Reexamination at iv, 18). Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 8 Board held that the term “memory device” is not limited to a single chip as argued by Rambus there and here, but encompasses the two disclosed embodiments also at issue here, the single chip semiconductor DRAM embodiment (see ‘263 patent, col. 4, ll. 10-24, Fig. 8A) and the memory stick embodiment comprising several chips (see id. at Fig. 9). Of course, the term “synchronous semiconductor memory device” is narrower than the term “synchronous memory device” (or “memory device”). The first term, in light of the specification, which refers to the term “semiconductor device[]” as “the invention” and as a “single memory device” with internal circuits (see P1 (emphasis added), P2, P3), indicates a chip, in line with the ordinary and customary meaning (D1, D2, D3) and in line with the similar Rambus claim term “integrated circuit device” at issue in Infineon, 318 F.3d at 1091. Mr. Murphy’s testimony is supported by trade dictionary definitions and the ‘263 patent and is not rebutted here, the expired ‘263 patent is not afforded “broadest reasonable” claim construction, cf. Yamamoto, 740 F.2d at 1571, and the Examiner has not shown persuasively that the claim term “synchronous semiconductor memory device” embraces the ‘263 patent’s memory stick embodiment and thereby reads on the iAPX’s memory module (see I1-I3.). DECISION The Examiner’s decision to reject appealed claim 1-4 is reversed. REVERSED Appeal 2011-013706 Reexamination Control 90/010,574 Patent 5,953,263 9 ak Finnegan, Henderson, Farabow Garrett & Dunner, LLP 901 New York Avenue, NW Washington, DC 20001-4413 Third Party Requester: Novak Druce & Quigg, LLP (NDQ Reexamination Group) 1000 Louisiana Street 53 rd Floor Houston, TX 77002 Copy with citationCopy as parenthetical citation